Inventor
PARK JAEWON
KR20 patents
⚠️ This page may combine multiple inventors who share the name “PARK JAEWON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
16 patentsUSD808406SJan 23, 2018
Display screen or portion thereof with transitional graphical user interface
SAMSUNG ELECTRONICS CO LTD83 citations98
USD886845SJun 9, 2020
Display screen or portion thereof with graphical user interface
SAMSUNG ELECTRONICS CO LTD29 citations97
USD821436SJun 26, 2018
Display screen or portion thereof with graphical user interface
SAMSUNG ELECTRONICS CO LTD38 citations97
USD932506SOct 5, 2021
Display screen or portion thereof with transitional graphical user interface
SAMSUNG ELECTRONICS CO LTD23 citations94
USD909405SFeb 2, 2021
Display screen or portion thereof with graphical user interface
SAMSUNG ELECTRONICS CO LTD13 citations94
USD886850SJun 9, 2020
Display screen or portion thereof with graphical user interface
SAMSUNG ELECTRONICS CO LTD24 citations94
USD872116SJan 7, 2020
Display screen or portion thereof with transitional graphical user interface
SAMSUNG ELECTRONICS CO LTD24 citations94
USD821435SJun 26, 2018
Display screen or portion thereof with graphical user interface
SAMSUNG ELECTRONICS CO LTD23 citations94
USD851110SJun 11, 2019
Display screen or portion thereof with graphical user interface
SAMSUNG ELECTRONICS CO LTD27 citations91
USD1015347SFeb 20, 2024
Display screen or portion thereof with graphical user interface
SAMSUNG ELECTRONICS CO LTD6 citations84
USD960903SAug 16, 2022
Display screen or portion thereof with transitional graphical user interface
SAMSUNG ELECTRONICS CO LTD10 citations84
USD1085154SJul 22, 2025
Display screen or portion thereof with transitional graphical user interface
SAMSUNG ELECTRONICS CO LTD4 citations74
USD1057744SJan 14, 2025
Display screen or portion thereof with transitional graphical user interface
SAMSUNG ELECTRONICS CO LTD4 citations67
US11899959B2Feb 13, 2024
Method of testing memory device, memory built-in self test (MBIST) circuit, and memory device for reducing test time
SAMSUNG ELECTRONICS CO LTD1 citations58
US12266414B2Apr 1, 2025
Memory device and test method of memory device
SAMSUNG ELECTRONICS CO LTD0 citations52
US12230345B2Feb 18, 2025
Built-in self-test circuits for memory systems having multiple channels
SAMSUNG ELECTRONICS CO LTD0 citations51
KOREA ATOMIC ENERGY RES
2 patentsUS8381803B2Feb 26, 2013
High temperature and high pressure corrosion resistant process heat exchanger for a nuclear hydrogen production system
KOREA ATOMIC ENERGY RES12 citations77
US7604846B2Oct 20, 2009
Manufacturing method of colored diamond by ion implantation and heat treatment
KOREA ATOMIC ENERGY RES5 citations56