Inventor
FURUKAWA OSAMU
JP43 patents
⚠️ This page may combine multiple inventors who share the name “FURUKAWA OSAMU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
13 patentsUS6262513B1Jul 17, 2001
Electronic component and method of production thereof
TOSHIBA KK163 citations97
US5164882ANov 17, 1992
Ceramic capacitor
TOSHIBA KK53 citations96
US6754950B2Jun 29, 2004
Electronic component and method of production thereof
TOSHIBA KK45 citations94
US6914367B2Jul 5, 2005
Surface acoustic wave device and method of manufacturing the device
TOSHIBA KK37 citations92
US5059566AOct 22, 1991
High-dielectric constant ceramic composite and ceramic capacitor elements
TOSHIBA KK23 citations92
US6628043B2Sep 30, 2003
Electronic component and method of production thereof
TOSHIBA KK30 citations91
US4772985ASep 20, 1988
Thick film capacitor
TOSHIBA KK24 citations82
US4767732AAug 30, 1988
High dielectric constant ceramic material and method of manufacturing the same
TOSHIBA KK22 citations81
US6339704B1Jan 15, 2002
Surface acoustic wave device and communication apparatus
TOSHIBA KK13 citations74
US4882652ANov 21, 1989
High dielectric constant type ceramic composition
TOSHIBA KK17 citations73
US4818736AApr 4, 1989
High dielectric constant type ceramic composition
TOSHIBA KK8 citations73
US8346513B2Jan 1, 2013
Three-dimensional data generation device, method and program thereof
TOSHIBA KK2 citations60
US8040344B2Oct 18, 2011
CAD system, control method and control program for same
TOSHIBA KK1 citations51
YOKOGAWA ELECTRIC CORP
7 patentsUS11326981B2May 10, 2022
Optical fiber characteristics measuring apparatus and optical fiber characteristics measuring method
YOKOGAWA ELECTRIC CORP4 citations73
US11047767B2Jun 29, 2021
Optical fiber characteristic measurement device and optical fiber characteristic measurement method
YOKOGAWA ELECTRIC CORP4 citations73
US9983095B2May 29, 2018
Optical fiber characteristic measuring device
YOKOGAWA ELECTRIC CORP5 citations73
US7511542B2Mar 31, 2009
Frequency dividing circuit
YOKOGAWA ELECTRIC CORP2 citations63
US11788898B2Oct 17, 2023
Abnormal temperature detection device, abnormal temperature detection method, and storage medium
YOKOGAWA ELECTRIC CORP1 citations62
US12339173B2Jun 24, 2025
Abnormal temperature detection device, abnormal temperature detection method, and non-transitory computer readable storage medium
YOKOGAWA ELECTRIC CORP0 citations52
US10018501B2Jul 10, 2018
Measuring apparatus for measuring vibration or displacement and method for measuring vibration or displacement
YOKOGAWA ELECTRIC CORP1 citations52
NIKON CORP
6 patentsUS6876946B2Apr 5, 2005
Alignment method and apparatus therefor
NIKON CORP80 citations98
US6278957B1Aug 21, 2001
Alignment method and apparatus therefor
NIKON CORP116 citations98
US5412214AMay 2, 1995
Projection exposure method and apparatus with focus detection
NIKON CORP102 citations96
US5365051ANov 15, 1994
Projection exposure apparatus
NIKON CORP76 citations96
US6583853B1Jun 24, 2003
Method of measuring exposure condition in projection exposure apparatus
NIKON CORP10 citations74
US6455214B1Sep 24, 2002
Scanning exposure method detecting focus during relative movement between energy beam and substrate
NIKON CORP10 citations73
TOKYO SHIBAURA ELECTRIC CO
5 patentsUS4527146AJul 2, 1985
Varistor
TOKYO SHIBAURA ELECTRIC CO15 citations74
US4516105AMay 7, 1985
Metal oxide varistor with non-diffusable electrodes
TOKYO SHIBAURA ELECTRIC CO8 citations74
US4540971ASep 10, 1985
Metal oxide varistor made by a co-precipation process and freeze-dried
TOKYO SHIBAURA ELECTRIC CO18 citations73
US4535314AAug 13, 1985
Varistor includes oxides of bismuth, cobalt, manganese, antimony, nickel and trivalent aluminum
TOKYO SHIBAURA ELECTRIC CO4 citations63
US4224174ASep 23, 1980
Piezoelectric oxide materials
TOKYO SHIBAURA ELECTRIC CO5 citations61