Inventor
PEEMEN MAURICE
NL17 patents
Patents
17 patentsUS11488800B2Nov 1, 2022
Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging
FEI CO2 citations71
US11151356B2Oct 19, 2021
Using convolution neural networks for on-the-fly single particle reconstruction
FEI CO2 citations71
US12175648B2Dec 24, 2024
Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method
FEI CO2 citations66
US12548732B2Feb 10, 2026
Application management for charged particle microscope devices
FEI CO0 citations61
US12288667B2Apr 29, 2025
Live-assisted image acquisition method and system with charged particle microscopy
FEI CO0 citations61
US12136532B2Nov 5, 2024
Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging
FEI CO0 citations61
US10903043B2Jan 26, 2021
Method, device and system for remote deep learning for microscopic image reconstruction and segmentation
FEI CO0 citations61
US12392735B2Aug 19, 2025
Sparse image reconstruction from neighboring tomography tilt images
FEI CO0 citations60
US11861817B2Jan 2, 2024
Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method
FEI CO0 citations59
US11100612B2Aug 24, 2021
Acquisition strategy for neural network based image restoration
FEI CO0 citations59
US11355305B2Jun 7, 2022
Low keV ion beam image restoration by machine learning for object localization
FEI CO0 citations53
US11569056B2Jan 31, 2023
Parameter estimation for metrology of features in an image
FEI CO0 citations51
US12347083B2Jul 1, 2025
Area selection in charged particle microscope imaging
FEI CO0 citations50
US11741730B2Aug 29, 2023
Charged particle microscope scan masking for three-dimensional reconstruction
FEI CO0 citations50
US11380529B2Jul 5, 2022
Depth reconstruction for 3D images of samples in a charged particle system
FEI CO0 citations45
US12553841B2Feb 17, 2026
Deep learning techniques for fast anomaly detection in experimental data
FEI CO0 citations40
US12531204B2Jan 20, 2026
Microscope aberration correction
FEI CO0 citations38