Inventor
MACHEK ONDREJ
CZ3 patents
Patents
3 patentsUS11901155B2Feb 13, 2024
Method of aligning a charged particle beam apparatus
FEI CO0 citations54
US11355305B2Jun 7, 2022
Low keV ion beam image restoration by machine learning for object localization
FEI CO0 citations53
US12223752B2Feb 11, 2025
Data acquisition in charged particle microscopy
FEI CO0 citations51