Inventor

NARA MASAYUKI

JP18 patents

⚠️ This page may combine multiple inventors who share the name “NARA MASAYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NARA MASAYUKI

MITUTOYO CORP

Method and program for estimating uncertainty

Method and apparatus for inspecting positioning machine by laser tracking interferometer

Measurement apparatus and measurement method

Two-dimensional lattice calibrating device, two-dimensional lattice calibrating method, two-dimensional lattice calibrating program and recording medium

Measurement method and measurement apparatus using tracking type laser interferometer

Form measuring device, form measuring method, form analysis device, form analysis program, and recording medium storing the program

Laser tracking interferometer

Three-dimensional-measuring-apparatus inspection gauges, three-dimensional-measuring-apparatus inspection methods and three-dimensional measuring apparatuses

Calibration method

Inspection method, correction method, and inspection device

Form measuring device, form measuring method, form analysis device, form analysis program, and recording medium storing the program

Measurement point determination method, non-transitory storage medium, and measurement point determination apparatus

Calibration method

Spatial accuracy correction method and apparatus

Spatial accuracy correction method and apparatus

NARA MASAYUKI

Measurement system and interferometer

Index error estimating apparatus, index error calibrating apparatus, and index error estimating method

Tracking type laser gauge interferometer with rotation mechanism correction