Inventor
PARK HAN-NA
KR6 patents
⚠️ This page may combine multiple inventors who share the name “PARK HAN-NA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
2 patentsUS7863914B2Jan 4, 2011
Method for testing semiconductor memory device using probe and semiconductor memory device using the same
SAMSUNG ELECTRONICS CO LTD9 citations82
US7501881B2Mar 10, 2009
Boosting voltage generating circuit for generating a stable boosting voltage under a wider range of supply voltage and semiconductor memory device having the same
SAMSUNG ELECTRONICS CO LTD9 citations82