Inventor
BHUSHAN MANJUL
28 patents
⚠️ This page may combine multiple inventors who share the name “BHUSHAN MANJUL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
18 patentsUS7190233B2Mar 13, 2007
Methods and apparatus for measuring change in performance of ring oscillator circuit
IBM35 citations92
US7069525B2Jun 27, 2006
Method and apparatus for determining characteristics of MOS devices
IBM22 citations92
US6960926B2Nov 1, 2005
Method and apparatus for characterizing a circuit with multiple inputs
IBM29 citations92
US6798261B1Sep 28, 2004
Method and apparatus for characterizing switching history impact
IBM31 citations92
US7504875B2Mar 17, 2009
Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuit
IBM10 citations84
US7355902B2Apr 8, 2008
Methods and apparatus for inline characterization of high speed operating margins of a storage element
IBM9 citations84
US7295057B2Nov 13, 2007
Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuit
IBM11 citations84
US7265639B2Sep 4, 2007
Methods and apparatus for ring oscillator based MOSFET gate capacitance measurements
IBM14 citations84
US7085658B2Aug 1, 2006
Method and apparatus for rapid inline measurement of parameter spreads and defects in integrated circuit chips
IBM14 citations84
US7504896B2Mar 17, 2009
Methods and apparatus for inline measurement of switching delay history effects in PD-SOI technology
IBM7 citations74
US7176695B2Feb 13, 2007
Method and apparatus for measuring transfer characteristics of a semiconductor device
IBM6 citations74
US7512509B2Mar 31, 2009
M1 testable addressable array for device parameter characterization
IBM3 citations63
US8589842B1Nov 19, 2013
Device-based random variability modeling in timing analysis
IBM4 citations62
US7342406B2Mar 11, 2008
Methods and apparatus for inline variability measurement of integrated circuit components
IBM2 citations61
US7583125B2Sep 1, 2009
Methods and apparatus for pulse generation used in characterizing electronic fuses
IBM0 citations52
US7145347B2Dec 5, 2006
Method and apparatus for measuring transfer characteristics of a semiconductor device
IBM0 citations52
US7595654B2Sep 29, 2009
Methods and apparatus for inline variability measurement of integrated circuit components
IBM0 citations51
US8027797B2Sep 27, 2011
Methods and apparatus for determining a switching history time constant in an integrated circuit device
IBM0 citations41
BHUSHAN MANJUL
6 patentsUS8456169B2Jun 4, 2013
High speed measurement of random variation/yield in integrated circuit device testing
BHUSHAN MANJUL3 citations62
US8310269B2Nov 13, 2012
Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditions
BHUSHAN MANJUL2 citations62
US8248094B2Aug 21, 2012
Acquisition of silicon-on-insulator switching history effects statistics
BHUSHAN MANJUL4 citations62
US8179120B2May 15, 2012
Single level of metal test structure for differential timing and variability measurements of integrated circuits
BHUSHAN MANJUL3 citations60
US9194909B2Nov 24, 2015
Single level of metal test structure for differential timing and variability measurements of integrated circuits
BHUSHAN MANJUL0 citations50
US9075109B2Jul 7, 2015
Single level of metal test structure for differential timing and variability measurements of integrated circuits
BHUSHAN MANJUL0 citations50