Inventor
HOSHI RYOJI
JP37 patents
⚠️ This page may combine multiple inventors who share the name “HOSHI RYOJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SHINETSU HANDOTAI KK
30 patentsUS6893499B2May 17, 2005
Silicon single crystal wafer and method for manufacturing the same
SHINETSU HANDOTAI KK21 citations92
US6632280B2Oct 14, 2003
Apparatus for growing single crystal, method for producing single crystal utilizing the apparatus and single crystal
SHINETSU HANDOTAI KK19 citations92
US6592662B2Jul 15, 2003
Method for preparing silicon single crystal and silicon single crystal
SHINETSU HANDOTAI KK22 citations91
US6117231ASep 12, 2000
Method of manufacturing semiconductor silicon single crystal wafer
SHINETSU HANDOTAI KK20 citations91
US6565822B1May 20, 2003
Epitaxial silicon wafer, method for producing the same and subtrate for epitaxial silicon wafer
SHINETSU HANDOTAI KK13 citations84
US7594966B2Sep 29, 2009
Method for producing a single crystal
SHINETSU HANDOTAI KK8 citations83
US5612539AMar 18, 1997
Method of evaluating lifetime related quality of semiconductor surface
SHINETSU HANDOTAI KK11 citations73
US5302832AApr 12, 1994
Method for evaluation of spatial distribution of deep level concentration in semiconductor crystal
SHINETSU HANDOTAI KK9 citations73
US10400353B2Sep 3, 2019
Method for controlling resistivity and N-type silicon single crystal
SHINETSU HANDOTAI KK2 citations72
US9773710B2Sep 26, 2017
Method for evaluating concentration of defect in silicon single crystal substrate
SHINETSU HANDOTAI KK3 citations72
US9111883B2Aug 18, 2015
Method for evaluating silicon single crystal and method for manufacturing silicon single crystal
SHINETSU HANDOTAI KK4 citations71
US6156119ADec 5, 2000
Silicon single crystal and method for producing the same
SHINETSU HANDOTAI KK13 citations71
US9938634B2Apr 10, 2018
Method of producing silicon single crystal
SHINETSU HANDOTAI KK3 citations70
US5598452AJan 28, 1997
Method of evaluating a silicon single crystal
SHINETSU HANDOTAI KK7 citations69
US7204881B2Apr 17, 2007
Silicon wafer for epitaxial growth, an epitaxial wafer, and a method for producing it
SHINETSU HANDOTAI KK4 citations62
US12084788B2Sep 10, 2024
Method for producing a silicon single crystal doped with nitrogen and having a controlled amount of carbon impurities
SHINETSU HANDOTAI KK0 citations61
US6632411B2Oct 14, 2003
Silicon wafer and method for producing silicon single crystal
SHINETSU HANDOTAI KK2 citations61
US11053606B2Jul 6, 2021
Method of producing silicon single crystal, and silicon single crystal wafer
SHINETSU HANDOTAI KK0 citations60
US9425345B2Aug 23, 2016
Epitaxial wafer and manufacturing method thereof
SHINETSU HANDOTAI KK1 citations52
US7201801B2Apr 10, 2007
Heater for manufacturing a crystal
SHINETSU HANDOTAI KK1 citations52
US10066322B2Sep 4, 2018
Method for heat treatment of silicon single crystal wafer
SHINETSU HANDOTAI KK0 citations51
US9938640B2Apr 10, 2018
Method for heat treatment of silicon single crystal wafer
SHINETSU HANDOTAI KK0 citations51
US9850595B2Dec 26, 2017
Method for heat treatment of silicon single crystal wafer
SHINETSU HANDOTAI KK1 citations51
US7909930B2Mar 22, 2011
Method for producing a silicon single crystal and a silicon single crystal
SHINETSU HANDOTAI KK0 citations51
US7396405B2Jul 8, 2008
Single crystal, single crystal wafer, epitaxial wafer, and method of growing single crystal
SHINETSU HANDOTAI KK0 citations51
US6764548B2Jul 20, 2004
Apparatus and method for producing silicon semiconductor single crystal
SHINETSU HANDOTAI KK0 citations50
US7713851B2May 11, 2010
Method of manufacturing silicon epitaxial wafer
SHINETSU HANDOTAI KK1 citations48
US9650725B2May 16, 2017
Method for manufacturing a defect-controlled low-oxygen concentration silicon single crystal wafer
SHINETSU HANDOTAI KK0 citations40
US9783912B2Oct 10, 2017
Silicon single crystal growing apparatus and method for growing silicon single crystal
SHINETSU HANDOTAI KK0 citations39
US10100430B2Oct 16, 2018
Method for growing silicon single crystal
SHINETSU HANDOTAI KK0 citations36
HOSHI RYOJI
3 patentsUS9260796B2Feb 16, 2016
Method for measuring distance between lower end surface of heat insulating member and surface of raw material melt and method for controlling thereof
HOSHI RYOJI5 citations70
US9217208B2Dec 22, 2015
Apparatus for producing single crystal
HOSHI RYOJI3 citations60
US8211228B2Jul 3, 2012
Method for producing single crystal and a method for producing annealed wafer
HOSHI RYOJI0 citations37
SUGAWARA KOSEI
2 patentsUS8885915B2Nov 11, 2014
Method for measuring and controlling distance between lower end surface of heat shielding member and surface of raw material melt and method for manufacturing silicon single crystal
SUGAWARA KOSEI3 citations57
US8083852B2Dec 27, 2011
Single crystal growth method and single crystal pulling apparatus
SUGAWARA KOSEI0 citations44