Inventor
TAMARAPALLI NAGESH
US18 patents
⚠️ This page may combine multiple inventors who share the name “TAMARAPALLI NAGESH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RAJSKI JANUSZ
6 patentsUS7512508B2Mar 31, 2009
Determining and analyzing integrated circuit yield and quality
RAJSKI JANUSZ54 citations97
US7653851B2Jan 26, 2010
Phase shifter with reduced linear dependency
RAJSKI JANUSZ32 citations96
US7523372B2Apr 21, 2009
Phase shifter with reduced linear dependency
RAJSKI JANUSZ42 citations96
US7263641B2Aug 28, 2007
Phase shifter with reduced linear dependency
RAJSKI JANUSZ51 citations96
US6966021B2Nov 15, 2005
Method and apparatus for at-speed testing of digital circuits
RAJSKI JANUSZ84 citations96
US7437636B2Oct 14, 2008
Method and apparatus for at-speed testing of digital circuits
RAJSKI JANUSZ10 citations82
MENTOR GRAPHICS CORP
6 patentsUS6070261AMay 30, 2000
Multi-phase test point insertion for built-in self test of integrated circuits
MENTOR GRAPHICS CORP42 citations96
US7987442B2Jul 26, 2011
Fault dictionaries for integrated circuit yield and quality analysis methods and systems
MENTOR GRAPHICS CORP38 citations92
US5737340AApr 7, 1998
Multi-phase test point insertion for built-in self test of integrated circuits
MENTOR GRAPHICS CORP39 citations92
US7805651B2Sep 28, 2010
Phase shifter with reduced linear dependency
MENTOR GRAPHICS CORP6 citations74
US7840862B2Nov 23, 2010
Enhanced diagnosis with limited failure cycles
MENTOR GRAPHICS CORP7 citations73
US8595574B2Nov 26, 2013
Enhanced diagnosis with limited failure cycles
MENTOR GRAPHICS CORP1 citations62