Inventor
LI YUN-CHIN
TW25 patents
⚠️ This page may combine multiple inventors who share the name “LI YUN-CHIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LI YUN-CHIN
9 patentsUS8902289B2Dec 2, 2014
Method for capturing three dimensional image
LI YUN-CHIN3 citations61
US8593508B2Nov 26, 2013
Method for composing three dimensional image with long focal length and three dimensional imaging system
LI YUN-CHIN3 citations61
US8339479B2Dec 25, 2012
Image capturing device and image synthesis method thereof
LI YUN-CHIN2 citations61
US8810634B2Aug 19, 2014
Method and apparatus for generating image with shallow depth of field
LI YUN-CHIN1 citations51
US8300084B2Oct 30, 2012
Method for real-time prompting stitching degree of panoramic image
LI YUN-CHIN1 citations51
US8179454B2May 15, 2012
Image compensation method and image acquisition device using the same
LI YUN-CHIN1 citations51
US9426370B2Aug 23, 2016
Image capturing device and exposure time adjusting method thereof
LI YUN-CHIN1 citations50
US8922678B2Dec 30, 2014
Electronic apparatus, image capturing apparatus, and method thereof
LI YUN-CHIN0 citations40
US8760530B2Jun 24, 2014
Image capturing apparatus, image capturing method and electronic apparatus
LI YUN-CHIN0 citations40
ALTEK SEMICONDUCTOR CORP
8 patentsUS11689822B2Jun 27, 2023
Dual sensor imaging system and privacy protection imaging method thereof
ALTEK SEMICONDUCTOR CORP5 citations72
US11496694B2Nov 8, 2022
Dual sensor imaging system and imaging method thereof
ALTEK SEMICONDUCTOR CORP2 citations70
US10165248B2Dec 25, 2018
Optimization method of image depth information and image processing apparatus
ALTEK SEMICONDUCTOR CORP2 citations66
US9179070B2Nov 3, 2015
Method for adjusting focus position and electronic apparatus
ALTEK SEMICONDUCTOR CORP1 citations51
US11568526B2Jan 31, 2023
Dual sensor imaging system and imaging method thereof
ALTEK SEMICONDUCTOR CORP0 citations49
US11496660B2Nov 8, 2022
Dual sensor imaging system and depth map calculation method thereof
ALTEK SEMICONDUCTOR CORP0 citations49
US11418719B2Aug 16, 2022
Dual sensor imaging system and calibration method which includes a color sensor and an infrared ray sensor to perform image alignment and brightness matching
ALTEK SEMICONDUCTOR CORP0 citations49
US10235773B2Mar 19, 2019
Image capturing device and calibration method of phase detection autofocus thereof
ALTEK SEMICONDUCTOR CORP0 citations40
ALTEK CORP
5 patentsUS8018495B2Sep 13, 2011
Image capturing apparatus with movement compensation function and method for movement compensation thereof
ALTEK CORP9 citations82
US8049785B2Nov 1, 2011
Optimum image selection method and system
ALTEK CORP3 citations60
US7978223B2Jul 12, 2011
Image capturing apparatus with suppression of image blur and method thereof for suppressing image blur
ALTEK CORP3 citations60
US7856178B2Dec 21, 2010
System for compensating camera movement and a calibration method thereof
ALTEK CORP4 citations60
US8350930B2Jan 8, 2013
Image capturing device and image synthesis method thereof
ALTEK CORP0 citations51