Inventor
LIU SIH-JIE
TW4 patents
Patents
4 patentsUS11348792B2May 31, 2022
Reduce well dopant loss in FinFETs through co-implantation
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations70
US11978634B2May 7, 2024
Reduce well dopant loss in FinFETs through co-implantation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US10930507B2Feb 23, 2021
Reduce well dopant loss in FinFETs through co-implantation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12283515B2Apr 22, 2025
Method and device to reduce epitaxial defects due to contact stress upon a semicondcutor wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49