Inventor · disambiguated record
Kenneth Carl Larsen
Also filed as: LARSEN KENNETH CARL
12 granted patents·148 citations·filing 1999–2007
90Inventor score
Files withIBM12
Top patents by PatentIndex Score
12 records- 0196US7453279B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Nov 18, 2008·30 cites·6 claims
- 0283US6229708B1Multi-axis microprocess or docking mechanismIBM·Filed 1999·Granted May 8, 2001·61 cites·36 claims
- 0380US6911836B2Apparatus for functional and stress testing of exposed chip land grid array devicesIBM·Filed 2003·Granted Jun 28, 2005·26 cites·18 claims
- 0478US6535391B2Cage assembly for front service access and method of useIBM·Filed 2001·Granted Mar 18, 2003·30 cites·28 claims
- 0559US7479796B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Jan 20, 2009·1 cites·14 claims
- 0647US7466155B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Dec 16, 2008·0 cites·7 claims
- 0747US7463017B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Dec 9, 2008·0 cites·3 claims
- 0847US7456644B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Nov 25, 2008·0 cites·5 claims
- 0947US7425822B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Sep 16, 2008·0 cites·1 claims
- 1047US7423440B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Sep 9, 2008·0 cites·6 claims
- 1147US7405583B2Functional and stress testing of LGA devicesIBM·Filed 2007·Granted Jul 29, 2008·0 cites·1 claims
- 1245US7352200B2Functional and stress testing of LGA devicesIBM·Filed 2005·Granted Apr 1, 2008·0 cites·14 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →