Inventor
MAEDA HIRONORI
JP37 patents
⚠️ This page may combine multiple inventors who share the name “MAEDA HIRONORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CANON KK
19 patentsUS9283720B2Mar 15, 2016
Position detection apparatus, imprint apparatus, and position detection method
CANON KK19 citations92
US8922786B2Dec 30, 2014
Detector, imprint apparatus, and article manufacturing method
CANON KK9 citations83
US10656541B2May 19, 2020
Measurement apparatus, exposure apparatus, and method of manufacturing article
CANON KK5 citations73
US9939741B2Apr 10, 2018
Lithography apparatus, and method of manufacturing article
CANON KK2 citations73
US9400436B2Jul 26, 2016
Detection device, exposure apparatus, and device manufacturing method using same
CANON KK4 citations73
US7580116B2Aug 25, 2009
Exposure apparatus and device fabrication method
CANON KK7 citations73
US11231573B2Jan 25, 2022
Position detection apparatus, exposure apparatus, and article manufacturing method
CANON KK3 citations70
US11333986B2May 17, 2022
Detection apparatus, exposure apparatus, and article manufacturing method
CANON KK0 citations62
US9523927B2Dec 20, 2016
Exposure apparatus with detection apparatus for detection of upper and lower surface marks, and device manufacturing method
CANON KK2 citations62
US12061079B2Aug 13, 2024
Detection method, detection apparatus, lithography apparatus, and article manufacturing method
CANON KK0 citations52
US9639000B2May 2, 2017
Position detector, position detection method, exposure apparatus, and method of manufacturing device
CANON KK0 citations52
US8345220B2Jan 1, 2013
Aberration measurement method, exposure apparatus, and device manufacturing method
CANON KK0 citations52
US8345221B2Jan 1, 2013
Aberration measurement method, exposure apparatus, and device manufacturing method
CANON KK0 citations52
US8049891B2Nov 1, 2011
Adjustment method for position detection apparatus, exposure apparatus, and device fabrication method
CANON KK1 citations52
US11169452B2Nov 9, 2021
Measurement apparatus, exposure apparatus, and method of manufacturing article
CANON KK0 citations51
US9645514B2May 9, 2017
Imprint apparatus, imprint method, and device manufacturing method
CANON KK0 citations51
US12366812B2Jul 22, 2025
Detection apparatus, detection method, exposure apparatus and article manufacturing method
CANON KK0 citations47
US9869936B2Jan 16, 2018
Detection apparatus, measurement apparatus, lithography apparatus, and method of manufacturing article
CANON KK0 citations41
US9718234B2Aug 1, 2017
Imprint lithography apparatus and device manufacturing method therefor
CANON KK0 citations41
MAEDA HIRONORI
8 patentsUS9061959B2Jun 23, 2015
Method for manufacturing optically active menthol
MAEDA HIRONORI2 citations62
US8217204B2Jul 10, 2012
Catalyst for asymmetric hydrogenation
MAEDA HIRONORI2 citations62
US8185339B2May 22, 2012
Test method and program product used therefor
MAEDA HIRONORI4 citations62
US9535321B2Jan 3, 2017
Imprint apparatus and article manufacturing method
MAEDA HIRONORI1 citations51
US9188855B2Nov 17, 2015
Imprint apparatus, imprint method, and device manufacturing method
MAEDA HIRONORI0 citations51
US8810772B2Aug 19, 2014
Position detector, position detection method, exposure apparatus, and method of manufacturing device to align wafer by adjusting optical member
MAEDA HIRONORI1 citations51
US8550711B2Oct 8, 2013
Treatment table system
MAEDA HIRONORI1 citations51
US9291921B2Mar 22, 2016
Detection apparatus, exposure apparatus, device fabrication method and filter to reduce a difference between detected intensity values of lights having different wavelength ranges
MAEDA HIRONORI0 citations41
ADVANTEST CORP
3 patentsUS6725449B1Apr 20, 2004
Semiconductor test program debugging apparatus
ADVANTEST CORP26 citations91
US9785542B2Oct 10, 2017
Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing
ADVANTEST CORP5 citations69
US9274911B2Mar 1, 2016
Using shared pins in a concurrent test execution environment
ADVANTEST CORP0 citations46
TAKASAGO PERFUMERY CO LTD
3 patentsUS11377411B2Jul 5, 2022
Method for producing 3-methylcycloalkenone compound
TAKASAGO PERFUMERY CO LTD0 citations52
US11407703B2Aug 9, 2022
Method for converting hydroxyl group of alcohol
TAKASAGO PERFUMERY CO LTD0 citations49
US7888513B2Feb 15, 2011
Condensation reaction by metal catalyst
TAKASAGO PERFUMERY CO LTD0 citations48
YAMADA SHINYA
2 patentsUS9000192B2Apr 7, 2015
Catalyst for asymmetric hydrogenation and method for manufacturing optically active carbonyl compound using the same
YAMADA SHINYA1 citations51
US8674144B2Mar 18, 2014
Catalyst for asymmetric hydrogenation and method for manufacturing optically active carbonyl compound using the same
YAMADA SHINYA0 citations41