Inventor

NAKATA YOSHIRO

JP27 patents

⚠️ This page may combine multiple inventors who share the name “NAKATA YOSHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NAKATA YOSHIRO

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

Probe card for wafer-level measurement, multilayer ceramic wiring board, and fabricating methods therefor

Method of testing electrical characteristics of multiple semiconductor integrated circuits simultaneously

Semiconductor device having a semiconductor substrate with reduced step between memory cells

Wafer burn-in cassette and method of manufacturing probe card for use therein

Semiconductor integrated circuit having a plurality of chips

Method of manufacturing probe card

Semiconductor integrated circuit device

Inspecting method for semiconductor devices

Semiconductor memory device in which a capacitor electrode of a memory cell and an interconnection layer of a peripheral circuit are formed in one level

Method for testing a semiconductor integrated circuit having self testing circuit

Semiconductor integrated circuit and a method of testing the same

Dram with concentric adjacent capacitors

Method for making semiconductor integration circuit with stacked capacitor cells

Thin-film semiconductor device and method of fabricating the same

Probe card

Method of evaluating a semiconductor device and an apparatus for performing the same

Semiconductor integrated circuit device having failure detection circuitry

Semiconductor integrated circuit testing system and method

Method of testing semiconductor integrated circuits and testing board for use therein

Method of testing semiconductor integrated circuits and testing board for use therein

Semiconductor device checking method

Semiconductor memory device and a manufacturing method thereof

NIHON MICRONICS KK

Semiconductor module, electrical connector, and inspection apparatus

Probe card and inspection device

Probe assembly and probe base plate

AGENCY IND SCIENCE TECHN

Semipermeable polymeric film membrane

PANASONIC CORP

Inspection apparatus and method for semiconductor IC