P

Inventor

YANAGISAWA MASAYUKI

JP8 patents
⚠️ This page may combine multiple inventors who share the name “YANAGISAWA MASAYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NEC CORP

4 patents
US5262258ANov 16, 1993

Process of manufacturing semiconductor devices

NEC CORP74 citations94
US5187550AFeb 16, 1993

Semiconductor device

NEC CORP23 citations90
US4806457AFeb 21, 1989

Method of manufacturing integrated circuit semiconductor device

NEC CORP46 citations90
US5290711AMar 1, 1994

Method for fabricating semiconductor devices which lessens the effect of electrostatic discharge

NEC CORP10 citations71

MICHIMATA SHIGETOMI

2 patents
US9217770B2Dec 22, 2015

Probe resistance measurement method and semiconductor device with pads for probe resistance measurement

MICHIMATA SHIGETOMI0 citations40
US8278935B2Oct 2, 2012

Probe resistance measurement method and semiconductor device with pads for probe resistance measurement

MICHIMATA SHIGETOMI0 citations40

NEC ELECTRONICS CORP

1 patent
US7361967B2Apr 22, 2008

Semiconductor device with fuse wires and connection wires

NEC ELECTRONICS CORP10 citations83

RENESAS ELECTRONICS CORP

1 patent
US7879532B2Feb 1, 2011

Method of manufacturing semiconductor device

RENESAS ELECTRONICS CORP0 citations50