Inventor
BUCKSCH THORSTEN
DE18 patents
⚠️ This page may combine multiple inventors who share the name “BUCKSCH THORSTEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
17 patentsUS7180313B2Feb 20, 2007
Test device for wafer testing digital semiconductor circuits
INFINEON TECHNOLOGIES AG44 citations92
US7421629B2Sep 2, 2008
Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure
INFINEON TECHNOLOGIES AG12 citations83
US7330378B2Feb 12, 2008
Inputting and outputting operating parameters for an integrated semiconductor memory device
INFINEON TECHNOLOGIES AG15 citations83
US7323861B2Jan 29, 2008
Contact plate for use in standardizing tester channels of a tester system and a standardization system having such a contact plate
INFINEON TECHNOLOGIES AG9 citations83
US7375508B2May 20, 2008
Device and a process for the calibration of a semiconductor component test system
INFINEON TECHNOLOGIES AG8 citations73
US6898739B2May 24, 2005
Method and device for testing a memory circuit
INFINEON TECHNOLOGIES AG7 citations73
US7061260B2Jun 13, 2006
Calibration device for the calibration of a tester channel of a tester device and a test system
INFINEON TECHNOLOGIES AG10 citations68
US7415649B2Aug 19, 2008
Semi-conductor component test device with shift register, and semi-conductor component test procedure
INFINEON TECHNOLOGIES AG5 citations62
US7184339B2Feb 27, 2007
Semi-conductor component, as well as a process for the in-or output of test data
INFINEON TECHNOLOGIES AG5 citations62
US6754869B2Jun 22, 2004
Method and device for testing set-up time and hold time of signals of a circuit with clocked data transfer
INFINEON TECHNOLOGIES AG4 citations62
US7061227B2Jun 13, 2006
Apparatus and method for calibrating a semiconductor test system
INFINEON TECHNOLOGIES AG5 citations54
US10438680B2Oct 8, 2019
Non-volatile memory testing
INFINEON TECHNOLOGIES AG0 citations51
US6750670B2Jun 15, 2004
Integrated test circuit
INFINEON TECHNOLOGIES AG0 citations51
US11556097B2Jan 17, 2023
Neural network circuitry for motors with first plurality of neurons and second plurality of neurons
INFINEON TECHNOLOGIES AG0 citations50
US11456646B2Sep 27, 2022
Neural network circuitry for motors
INFINEON TECHNOLOGIES AG0 citations50
US7317323B2Jan 8, 2008
Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor components
INFINEON TECHNOLOGIES AG0 citations41
US12525902B2Jan 13, 2026
Shuntless motor control for DC motors
INFINEON TECHNOLOGIES AG0 citations38