Inventor
YAMAGATA TADATO
JP46 patents
⚠️ This page may combine multiple inventors who share the name “YAMAGATA TADATO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
39 patentsUS5726946AMar 10, 1998
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP224 citations99
US5319589AJun 7, 1994
Dynamic content addressable memory device and a method of operating thereof
MITSUBISHI ELECTRIC CORP143 citations98
US6310815B1Oct 30, 2001
Multi-bank semiconductor memory device suitable for integration with logic
MITSUBISHI ELECTRIC CORP98 citations97
US6643208B2Nov 4, 2003
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP32 citations96
US6134171AOct 17, 2000
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP68 citations96
US5959927ASep 28, 1999
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP33 citations96
US6525984B2Feb 25, 2003
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP17 citations93
US6515922B1Feb 4, 2003
Memory module
MITSUBISHI ELECTRIC CORP22 citations93
US6341098B2Jan 22, 2002
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP14 citations93
US6246625B1Jun 12, 2001
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP19 citations93
US6163493ADec 19, 2000
Semiconductor integrated circuit device with large internal bus width, including memory and logic circuit
MITSUBISHI ELECTRIC CORP32 citations93
US5910181AJun 8, 1999
Semiconductor integrated circuit device comprising synchronous DRAM core and logic circuit integrated into a single chip and method of testing the synchronous DRAM core
MITSUBISHI ELECTRIC CORP40 citations93
US5798974AAug 25, 1998
Semiconductor memory device realizing high speed access and low power consumption with redundant circuit
MITSUBISHI ELECTRIC CORP32 citations93
US5404329AApr 4, 1995
Boosting circuit improved to operate in a wider range of power supply voltage, and a semiconductor memory and a semiconductor integrated circuit device using the same
MITSUBISHI ELECTRIC CORP29 citations93
US5388066AFeb 7, 1995
Content addressable memory device and a method of disabling a coincidence word thereof
MITSUBISHI ELECTRIC CORP36 citations93
US5367493ANov 22, 1994
Dynamic type semiconductor memory device having reduced peak current during refresh mode and method of operating the same
MITSUBISHI ELECTRIC CORP25 citations93
US5228000AJul 13, 1993
Test circuit of semiconductor memory device
MITSUBISHI ELECTRIC CORP22 citations93
US5158899AOct 27, 1992
Method of manufacturing input circuit of semiconductor device
MITSUBISHI ELECTRIC CORP24 citations93
US5016220AMay 14, 1991
Semiconductor memory device with logic level responsive testing circuit and method therefor
MITSUBISHI ELECTRIC CORP34 citations93
US4984054AJan 8, 1991
Electric fuse for a redundancy circuit
MITSUBISHI ELECTRIC CORP38 citations93
US4974053ANov 27, 1990
Semiconductor device for multiple packaging configurations
MITSUBISHI ELECTRIC CORP34 citations93
US4788455ANov 29, 1988
CMOS reference voltage generator employing separate reference circuits for each output transistor
MITSUBISHI ELECTRIC CORP33 citations93
US4780850AOct 25, 1988
CMOS dynamic random access memory
MITSUBISHI ELECTRIC CORP45 citations93
US5930194AJul 27, 1999
Semiconductor memory device capable of block writing in large bus width
MITSUBISHI ELECTRIC CORP37 citations92
US5475638ADec 12, 1995
Static random access memory device having a single bit line configuration
MITSUBISHI ELECTRIC CORP23 citations92
US5146300ASep 8, 1992
Semiconductor integrated circuit device having improved stacked capacitor and manufacturing method therefor
MITSUBISHI ELECTRIC CORP47 citations92
US6069379AMay 30, 2000
Semiconductor device and method of manufacturing the same
MITSUBISHI ELECTRIC CORP11 citations74
US5726943AMar 10, 1998
Fast memory device allowing suppression of peak value of operational current
MITSUBISHI ELECTRIC CORP15 citations74
US5694354ADec 2, 1997
Static random access memory device having a single bit line configuration
MITSUBISHI ELECTRIC CORP11 citations74
US5572469ANov 5, 1996
Static random access memory device having a single bit line configuration
MITSUBISHI ELECTRIC CORP6 citations74
US5126968AJun 30, 1992
Content addressable semiconductor memory device and operating method therefor
MITSUBISHI ELECTRIC CORP16 citations74
US5083188AJan 21, 1992
Integrated circuit having superconductive wirings
MITSUBISHI ELECTRIC CORP7 citations74
US4904885AFeb 27, 1990
Substrate bias circuit having substrate bias voltage clamp and operating method therefor
MITSUBISHI ELECTRIC CORP13 citations74
US4734889AMar 29, 1988
Semiconductor memory
MITSUBISHI ELECTRIC CORP13 citations74
US5677889AOct 14, 1997
Static type semiconductor device operable at a low voltage with small power consumption
MITSUBISHI ELECTRIC CORP17 citations73
US6214664B1Apr 10, 2001
Method of manufacturing semiconductor device
MITSUBISHI ELECTRIC CORP3 citations63
US5418923AMay 23, 1995
Circuit for prioritizing outputs of an associative memory with parallel inhibition paths and a compact architecture
MITSUBISHI ELECTRIC CORP6 citations63
US4870620ASep 26, 1989
Dynamic random access memory device with internal refresh
MITSUBISHI ELECTRIC CORP6 citations63
US5650978AJul 22, 1997
Semiconductor memory device having data transition detecting function
MITSUBISHI ELECTRIC CORP5 citations62
RENESAS TECH CORP
4 patentsUS6650588B2Nov 18, 2003
Semiconductor memory module and register buffer device for use in the same
RENESAS TECH CORP84 citations98
US6844754B2Jan 18, 2005
Data bus
RENESAS TECH CORP64 citations96
USRE39579EApr 17, 2007
Semiconductor integrated circuit device comprising RAM with command decode system and logic circuit integrated into a single chip and testing method of the RAM with command decode system
RENESAS TECH CORP4 citations63
US6859377B2Feb 22, 2005
Dynamic associative memory device
RENESAS TECH CORP6 citations63