Inventor
KUNWAR ANSHUMAN
US4 patents
Patents
4 patentsUS11144701B2Oct 12, 2021
System and method for key parameter identification, process model calibration and variability analysis in a virtual semiconductor device fabrication environment
COVENTOR INC15 citations91
US11861289B2Jan 2, 2024
System and method for performing process model calibration in a virtual semiconductor device fabrication environment
COVENTOR INC2 citations70
US12475297B2Nov 18, 2025
System and method for performing process model calibration in a virtual semiconductor device fabrication environment
COVENTOR INC0 citations60
US12423486B2Sep 23, 2025
System and method for process window optimization in a virtual semiconductor device fabrication environment
COVENTOR INC0 citations49