Inventor
TAMAKI NAOYA
JP14 patents
Patents
14 patentsUS5784285AJul 21, 1998
Waveform analyzer
NEC CORP67 citations96
US6842093B2Jan 11, 2005
Radio frequency circuit module on multi-layer substrate
NEC CORP15 citations92
US6661318B2Dec 9, 2003
Radio frequency circuit module on multi-layer substrate
NEC CORP25 citations92
US6396264B1May 28, 2002
Triplate striplines used in a high-frequency circuit and a shielded-loop magnetic field detector
NEC CORP26 citations92
US6300779B1Oct 9, 2001
Semiconductor device evaluation apparatus and semiconductor device evaluation program product
NEC CORP17 citations92
US6281697B1Aug 28, 2001
Semiconductor device evaluation apparatus
NEC CORP34 citations92
US6144196ANov 7, 2000
Magnetic field measuring apparatus and apparatus for measuring spatial resolution of magnetic field detector
NEC CORP21 citations92
US6661243B2Dec 9, 2003
Semiconductor device evaluation apparatus and semiconductor device evaluation program product
NEC CORP13 citations83
US6847276B2Jan 25, 2005
Radio frequency circuit module on multi-layer substrate
NEC CORP9 citations73
US6320376B1Nov 20, 2001
Magnetic field sensor and system for measuring a magnetic field including a plurality of conductors electrically connected in a loop
NEC CORP9 citations73
US6163150ADec 19, 2000
Magnetic field sensor
NEC CORP3 citations63
US7504837B2Mar 17, 2009
Electrical characteristics measurement method and electrical characteristics measurement device
NEC CORP2 citations62
US6882542B2Apr 19, 2005
Electronic apparatus
NEC CORP6 citations62
US6750648B1Jun 15, 2004
Magnetic field detector having a dielectric looped face
NEC CORP5 citations62