Inventor
KIM DUG-YOUNG
KR11 patents
⚠️ This page may combine multiple inventors who share the name “KIM DUG-YOUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
4 patentsUS6813959B2Nov 9, 2004
Apparatus and method for measuring residual stress and photoelastic effect of optical fiber
SAMSUNG ELECTRONICS CO LTD14 citations83
US6647162B2Nov 11, 2003
Apparatus and method for measuring residual stress and photoelastic effect of optical fiber
SAMSUNG ELECTRONICS CO LTD15 citations83
US6678433B2Jan 13, 2004
Apparatus and method for measuring residual stress and photoelastic effect of optical fiber
SAMSUNG ELECTRONICS CO LTD7 citations73
US6373564B1Apr 16, 2002
Image tracking device and method for transverse measurement of optical fiber
SAMSUNG ELECTRONICS CO LTD4 citations62
KIM DUG YOUNG
3 patentsUS8314405B2Nov 20, 2012
Apparatus for measuring fluorescence lifetime
KIM DUG YOUNG4 citations55
US8064064B2Nov 22, 2011
Apparatus and method for obtaining images using coherent anti-stokes Raman scattering
KIM DUG YOUNG1 citations46
US8098371B2Jan 17, 2012
Apparatus for measuring residual stress of optical fiber
KIM DUG YOUNG0 citations38
KWANGJU INST SCI & TECH
2 patentsUS7679038B2Mar 16, 2010
Optical phase microscope using rotating 1/4 wavelength plate with pinhole in the center position and Fourier transformed lens
KWANGJU INST SCI & TECH5 citations61
US7369249B2May 6, 2008
Apparatus for measuring differential mode delay of multimode optical fiber
KWANGJU INST SCI & TECH2 citations56
YONSEI UNIV INDUSTRY FOUNDATION YONSEI UIF
2 patentsUS11280736B2Mar 22, 2022
Fluorescence lifetime measurement device for analyzing multi-exponential decay function type experimental data at high speed and measurement method therefor
YONSEI UNIV INDUSTRY FOUNDATION YONSEI UIF0 citations44
US10845311B2Nov 24, 2020
Fluorescence lifetime measurement apparatus and method capable of finding two or more fluorescence lifetime components by computing least square error through virtual fluorescence distribution model from signal collected in analog mean delay method
YONSEI UNIV INDUSTRY FOUNDATION YONSEI UIF0 citations34