Inventor
SCAMAN MICHAEL E
US16 patents
⚠️ This page may combine multiple inventors who share the name “SCAMAN MICHAEL E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
14 patentsUS7353472B2Apr 1, 2008
System and method for testing pattern sensitive algorithms for semiconductor design
IBM14 citations92
US6242923B1Jun 5, 2001
Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards
IBM37 citations92
US6141093AOct 31, 2000
Method and apparatus for locating power plane shorts using polarized light microscopy
IBM31 citations92
US5821759AOct 13, 1998
Method and apparatus for detecting shorts in a multi-layer electronic package
IBM44 citations92
US7187179B1Mar 6, 2007
Wiring test structures for determining open and short circuits in semiconductor devices
IBM28 citations90
US7360199B2Apr 15, 2008
Iterative method for refining integrated circuit layout using compass optical proximity correction (OPC)
IBM10 citations83
US6400128B2Jun 4, 2002
Thermal modulation system and method for locating a circuit defect
IBM12 citations73
US5936408AAug 10, 1999
Simplified contactless test of MCM thin film I/O nets using a plasma
IBM6 citations73
US5818239AOct 6, 1998
Simplified contactless test of MCM thin film I/O nets using a plasma
IBM15 citations73
US5448650ASep 5, 1995
Thin-film latent open optical detection with template-based feature extraction
IBM12 citations67
US6236196B1May 22, 2001
Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometry
IBM4 citations62
US7685544B2Mar 23, 2010
Testing pattern sensitive algorithms for semiconductor design
IBM0 citations51
US7673279B2Mar 2, 2010
Iterative method for refining integrated circuit layout using compass optical proximity correction (OPC)
IBM0 citations51
US7808257B2Oct 5, 2010
Ionization test for electrical verification
IBM0 citations46