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Inventor
JORDAN III JOHN RAYMOND
US
3 patents
Patents
3 patents
US10186026B2
Jan 22, 2019
Single image detection
KLA TENCOR CORP
10 citations
80
US9355208B2
May 31, 2016
Detecting defects on a wafer
KLA TENCOR CORP
8 citations
79
US9489599B2
Nov 8, 2016
Decision tree construction for automatic classification of defects on semiconductor wafers
KLA TENCOR CORP
0 citations
36