Inventor
ABE YOSHIHISA
JP39 patents
⚠️ This page may combine multiple inventors who share the name “ABE YOSHIHISA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KONICA MINOLTA SENSING INC
8 patentsUS7812969B2Oct 12, 2010
Three-dimensional shape measuring apparatus
KONICA MINOLTA SENSING INC33 citations92
US7724380B2May 25, 2010
Method and system for three-dimensional measurement
KONICA MINOLTA SENSING INC32 citations92
US7715020B2May 11, 2010
Three-dimensional shape measuring system
KONICA MINOLTA SENSING INC15 citations84
US7684613B2Mar 23, 2010
Method and system for aligning three-dimensional shape data from photogrammetry data and three-dimensional measurement data using target locations and surface vectors
KONICA MINOLTA SENSING INC9 citations81
US7436525B2Oct 14, 2008
Three-dimensional shape measuring method, three-dimensional shape measuring apparatus, and focus adjusting method
KONICA MINOLTA SENSING INC9 citations80
US7643159B2Jan 5, 2010
Three-dimensional shape measuring system, and three-dimensional shape measuring method
KONICA MINOLTA SENSING INC2 citations63
US7495776B2Feb 24, 2009
Three-dimensional measuring system
KONICA MINOLTA SENSING INC3 citations62
US7764386B2Jul 27, 2010
Method and system for three-dimensional measurement and method and device for controlling manipulator
KONICA MINOLTA SENSING INC0 citations41
COORSTEK KK
8 patentsUS11201217B2Dec 14, 2021
Nitride semiconductor substrate
COORSTEK KK2 citations72
US10068858B2Sep 4, 2018
Compound semiconductor substrate
COORSTEK KK2 citations71
US11605716B2Mar 14, 2023
Nitride semiconductor substrate and method of manufacturing the same
COORSTEK KK0 citations62
US9748344B2Aug 29, 2017
Nitride semiconductor substrate having recesses at interface between base substrate and initial nitride
COORSTEK KK1 citations50
US10559679B2Feb 11, 2020
Nitride semiconductor epitaxial substrate
COORSTEK KK0 citations49
US10593790B2Mar 17, 2020
Nitride semiconductor substrate and method for manufacturing the same
COORSTEK KK0 citations48
US10825895B2Nov 3, 2020
Nitride semiconductor substrate
COORSTEK KK0 citations41
US9530846B2Dec 27, 2016
Nitride semiconductor substrate
COORSTEK KK0 citations39
KONICA MINOLTA INC
4 patentsUS11089225B2Aug 10, 2021
Optical measuring device, image generating method, and image generating program
KONICA MINOLTA INC0 citations49
US11280677B2Mar 22, 2022
Colorimeter capable of taking a fixed posture with respect to a measurement object
KONICA MINOLTA INC0 citations46
US9885668B2Feb 6, 2018
Surface inspection device, surface inspection method, and program
KONICA MINOLTA INC0 citations40
US9976905B2May 22, 2018
Surface characteristic measurement device
KONICA MINOLTA INC0 citations39
MINOLTA CO LTD
3 patentsUS6798527B2Sep 28, 2004
Three-dimensional shape-measuring system
MINOLTA CO LTD44 citations88
US6958753B2Oct 25, 2005
Method and apparatus for reducing three-dimensional shape data
MINOLTA CO LTD11 citations74
US6778172B2Aug 17, 2004
Method and apparatus for extracting surface from three-dimensional shape data as well as recording medium
MINOLTA CO LTD8 citations72
COVALENT MATERIALS CORP
3 patentsUS7368757B2May 6, 2008
Compound semiconductor and compound semiconductor device using the same
COVALENT MATERIALS CORP8 citations74
US7262485B2Aug 28, 2007
Substrate for growing electro-optical single crystal thin film and method of manufacturing the same
COVALENT MATERIALS CORP1 citations52
US8637960B2Jan 28, 2014
Nitride semiconductor substrate
COVALENT MATERIALS CORP1 citations51