Inventor

WATANABE KENJI

JP481 patents

⚠️ This page may combine multiple inventors who share the name “WATANABE KENJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WATANABE KENJI

SEIKO EPSON CORP

Tape printing device and tape cartridge used therein

Tape printing device and tape cartridge used therein

Tape printing device and tape cartridge used therein

Tape printing device and tape cartridge used therein

Tape cartidge and printing device

Tape cartridge and printing device having print medium cartridge

Tape printing device and cartridge used therein

Tape printing device and tape cartridge used therein

Tape printing device and tape cartridge used therein

Tape printing device and tape cartridge used therein

Tape printing device and tape cartridge used therein

Tape printing device and tape cartridge used therein

Tape printing device and tape cartridge used therein

Tape printing device and tape cartridge used therein having a cover with detection means

Tape printing device and tape cartridge used therein

Tape printing device with display

Tape cartridge and printing device

Tape cartridge and printing device

EBARA CORP

Testing apparatus using charged particles and device manufacturing method using the testing apparatus

Method for inspecting substrate, substrate inspecting system and electron beam apparatus

Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former

Electron beam apparatus and method of manufacturing semiconductor device using the apparatus

Inspection system by charged particle beam and method of manufacturing devices using the system

Objective lens, electron beam system and method of inspecting defect

Method and apparatus for repairing shape, and method for manufacturing semiconductor device using those

Testing apparatus using charged particles and device manufacturing method using the testing apparatus

Testing apparatus using charged particles and device manufacturing method using the testing apparatus

Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former

HITACHI LTD

Method and apparatus for observing and inspecting defects

Scanning electron microscope having magnification switching control

Method and apparatus for inspecting a semiconductor device

Method and its apparatus for inspecting particles or defects of a semiconductor device

Method of inspecting circuit pattern and inspecting instrument

Method of inspecting pattern and inspecting instrument

Process control system

KING JIM CO LTD

Electronic printer camera

Tape printing device

Tape printing device

Tape printing device with character enlargement and rotation logic

Tape printing device with cutter and program to allow for printing on the tape during an acceleration of the tape

Tape printing device

TOSHIBA KK

Electron beam inspection system and inspection method and method of manufacturing devices using the system

Electron beam apparatus and device manufacturing method using same

Inspection system by charged particle beam and method of manufacturing devices using the system

HITACHI HIGH TECH ELECT ENG CO

Method of inspecting a semiconductor device and an apparatus thereof

Surface inspection apparatus and method thereof

KAWASAKI STEEL CO

Process for electroplating stainless steel strips with zinc or zinc-nickel alloy

Zn-coated stainless steel welded pipe

HONDA MOTOR CO LTD

Process for evaluating remaining capacity of battery

NIKON CORP

Electron beam apparatus and method of manufacturing semiconductor device using the apparatus