Inventor
MICHAEL DAVID
US25 patents
⚠️ This page may combine multiple inventors who share the name “MICHAEL DAVID”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
COGNEX CORP
14 patentsUS6137893AOct 24, 2000
Machine vision calibration targets and methods of determining their location and orientation in an image
COGNEX CORP166 citations99
US5768443AJun 16, 1998
Method for coordinating multiple fields of view in multi-camera
COGNEX CORP381 citations99
US5987172ANov 16, 1999
Edge peak contour tracker
COGNEX CORP91 citations98
US5548326AAug 20, 1996
Efficient image registration
COGNEX CORP141 citations98
US6240218B1May 29, 2001
Apparatus and method for determining the location and orientation of a reference feature in an image
COGNEX CORP80 citations96
US5978081ANov 2, 1999
Multiple field of view calibration plate for use in semiconductor manufacturing
COGNEX CORP62 citations96
US5943441AAug 24, 1999
Edge contour tracking from a first edge point
COGNEX CORP57 citations96
US5825483AOct 20, 1998
Multiple field of view calibration plate having a reqular array of features for use in semiconductor manufacturing
COGNEX CORP90 citations96
US6061467AMay 9, 2000
Automated optical inspection apparatus using nearest neighbor interpolation
COGNEX CORP28 citations92
US5872870AFeb 16, 1999
Machine vision methods for identifying extrema of objects in rotated reference frames
COGNEX CORP50 citations92
US5757956AMay 26, 1998
Template rotating method for locating bond pads in an image
COGNEX CORP46 citations92
US5754679AMay 19, 1998
Image rotating method for locating bond pads in an image
COGNEX CORP24 citations92
US5751853AMay 12, 1998
Locating shapes in two-dimensional space curves
COGNEX CORP39 citations92
US10864639B2Dec 15, 2020
Simultaneous kinematic and hand-eye calibration
COGNEX CORP0 citations49
COGNEX TECH & INVESTMENT CORP
4 patentsUS7171036B1Jan 30, 2007
Method and apparatus for automatic measurement of pad geometry and inspection thereof
COGNEX TECH & INVESTMENT CORP54 citations96
US7242801B1Jul 10, 2007
Image preprocessing for probe mark inspection
COGNEX TECH & INVESTMENT CORP12 citations84
US6970608B1Nov 29, 2005
Method for obtaining high-resolution performance from a single-chip color image sensor
COGNEX TECH & INVESTMENT CORP14 citations84
US7965887B2Jun 21, 2011
Method of pattern location using color image data
COGNEX TECH & INVESTMENT CORP3 citations63