Inventor
SEKI HIROKAZU
JP25 patents
⚠️ This page may combine multiple inventors who share the name “SEKI HIROKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JAPAN DISPLAY INC
7 patentsUS10460694B2Oct 29, 2019
Display device
JAPAN DISPLAY INC2 citations69
US10186229B2Jan 22, 2019
Display device
JAPAN DISPLAY INC2 citations69
US12353099B2Jul 8, 2025
Display device
JAPAN DISPLAY INC0 citations62
US12022705B2Jun 25, 2024
Display device
JAPAN DISPLAY INC0 citations62
US11751452B2Sep 5, 2023
Display device
JAPAN DISPLAY INC0 citations62
US11227909B2Jan 18, 2022
Display device
JAPAN DISPLAY INC0 citations62
US10644095B2May 5, 2020
Display device
JAPAN DISPLAY INC0 citations51
SONY SEMICONDUCTOR SOLUTIONS CORP
5 patentsUS11785321B2Oct 10, 2023
Imaging device
SONY SEMICONDUCTOR SOLUTIONS CORP2 citations70
US12040338B2Jul 16, 2024
Imaging apparatus
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations62
US11330209B2May 10, 2022
Imaging device and electronic device enabled to control position of lens
SONY SEMICONDUCTOR SOLUTIONS CORP1 citations60
US11356584B2Jun 7, 2022
Camera module, production method, and electronic device
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations49
US10720459B2Jul 21, 2020
Imaging element package and camera module having a slit formed in an adhesive connecting a flexible substrate and another member to address differences in linear expansion coefficients
SONY SEMICONDUCTOR SOLUTIONS CORP0 citations49
FUJIMOTO SEIYAKU KK
3 patentsASAHI GLASS CO LTD
2 patentsSTANLEY ELECTRIC CO LTD
2 patentsSONY CORP
2 patentsLASERTEC CORP
2 patentsUS9551672B2Jan 24, 2017
Defect classifying method and optical inspection apparatus for silicon carbide substrate
LASERTEC CORP4 citations63
US12361536B2Jul 15, 2025
EUV mask inspection device, EUV mask inspection method, non-transitory computer-readable medium storing EUV mask inspection program, and EUV mask inspection system including a gray image based on design data of a pattern
LASERTEC CORP0 citations52