P

Inventor

HSU TING-HAO

TW29 patents
⚠️ This page may combine multiple inventors who share the name “HSU TING-HAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

19 patents
US9658526B2May 23, 2017

Mask pellicle indicator for haze prevention

TAIWAN SEMICONDUCTOR MFG CO LTD9 citations82
US11411535B2Aug 9, 2022

Semiconductor device and operation method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10958216B2Mar 23, 2021

Semiconductor device and operation method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10126644B2Nov 13, 2018

Pellicle for advanced lithography

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9933699B2Apr 3, 2018

Pellicle aging estimation and particle removal from pellicle via acoustic waves

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US12013646B2Jun 18, 2024

High throughput and high position accurate method for particle inspection of mask pods

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations69
US11614691B2Mar 28, 2023

High throughput and high position accurate method for particle inspection of mask pods

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations69
US12429776B2Sep 30, 2025

Lithography method with reduced impacts of mask defects

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11722099B2Aug 8, 2023

Semiconductor device and operation method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10955746B2Mar 23, 2021

Lithography method with reduced impacts of mask defects

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US9418847B2Aug 16, 2016

Lithography system and method for haze elimination

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations62
US12140857B2Nov 12, 2024

Method of fast surface particle and scratch detection for EUV mask backside

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11768431B2Sep 26, 2023

Method of fast surface particle and scratch detection for EUV mask backside

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11079669B2Aug 3, 2021

System and method for localized EUV pellicle glue removal

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US10520805B2Dec 31, 2019

System and method for localized EUV pellicle glue removal

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations60
US12393124B2Aug 19, 2025

High throughput and high position accurate method for particle inspection of mask pods

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US11855099B2Dec 26, 2023

Metal-insulator-semiconductor tunnel diode memory

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10691017B2Jun 23, 2020

Pellicle for advanced lithography

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9548209B2Jan 17, 2017

Method for integrated circuit fabrication

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations51

TAIWAN SEMICONDUCTOR MFG

4 patents

YU CHING-FANG

2 patents

LIN MEI-CHUN

1 patent

TEKTRO TECHNOLOGY CORP

1 patent

LEE HSIN-CHANG

1 patent

LU CHI-LUN

1 patent