Inventor
HSU TING-HAO
TW29 patents
⚠️ This page may combine multiple inventors who share the name “HSU TING-HAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
19 patentsUS9658526B2May 23, 2017
Mask pellicle indicator for haze prevention
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations82
US11411535B2Aug 9, 2022
Semiconductor device and operation method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10958216B2Mar 23, 2021
Semiconductor device and operation method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10126644B2Nov 13, 2018
Pellicle for advanced lithography
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9933699B2Apr 3, 2018
Pellicle aging estimation and particle removal from pellicle via acoustic waves
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US12013646B2Jun 18, 2024
High throughput and high position accurate method for particle inspection of mask pods
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations69
US11614691B2Mar 28, 2023
High throughput and high position accurate method for particle inspection of mask pods
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations69
US12429776B2Sep 30, 2025
Lithography method with reduced impacts of mask defects
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11722099B2Aug 8, 2023
Semiconductor device and operation method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10955746B2Mar 23, 2021
Lithography method with reduced impacts of mask defects
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US9418847B2Aug 16, 2016
Lithography system and method for haze elimination
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations62
US12140857B2Nov 12, 2024
Method of fast surface particle and scratch detection for EUV mask backside
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11768431B2Sep 26, 2023
Method of fast surface particle and scratch detection for EUV mask backside
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11079669B2Aug 3, 2021
System and method for localized EUV pellicle glue removal
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US10520805B2Dec 31, 2019
System and method for localized EUV pellicle glue removal
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations60
US12393124B2Aug 19, 2025
High throughput and high position accurate method for particle inspection of mask pods
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US11855099B2Dec 26, 2023
Metal-insulator-semiconductor tunnel diode memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10691017B2Jun 23, 2020
Pellicle for advanced lithography
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9548209B2Jan 17, 2017
Method for integrated circuit fabrication
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations51
TAIWAN SEMICONDUCTOR MFG
4 patentsUS8980108B1Mar 17, 2015
Method for integrated circuit fabrication
TAIWAN SEMICONDUCTOR MFG7 citations83
US9354510B2May 31, 2016
EUV mask and method for forming the same
TAIWAN SEMICONDUCTOR MFG3 citations72
US9152035B2Oct 6, 2015
Lithographic photomask with inclined sides
TAIWAN SEMICONDUCTOR MFG1 citations51
US8932958B2Jan 13, 2015
Device manufacturing and cleaning method
TAIWAN SEMICONDUCTOR MFG0 citations51