Inventor
KRISCH BURKHARD
8 patents
Patents
8 patentsUS4211924AJul 8, 1980
Transmission-type scanning charged-particle beam microscope
SIEMENS AG58 citations92
US4044255AAug 23, 1977
Corpuscular-beam transmission-type microscope including an improved beam deflection system
SIEMENS AG50 citations90
US6035721AMar 14, 2000
Process for compensating for the incorrect operation of measuring devices caused by external influences
SIEMENS AG19 citations82
US4038543AJul 26, 1977
Scanning transmission electron microscope including an improved image detector
SIEMENS AG22 citations79
US5691479ANov 25, 1997
Pressure transducer with a housing for use with a conventionally packaged pressure sensor
SIEMENS AG12 citations71
US4044254AAug 23, 1977
Scanning corpuscular-beam transmission type microscope including a beam energy analyzer
SIEMENS AG11 citations71
US4097739AJun 27, 1978
Beam deflection and focusing system for a scanning corpuscular-beam microscope
SIEMENS AG6 citations61
US4044256AAug 23, 1977
Support stand for a corpuscular-beam microscope
SIEMENS AG3 citations58