Inventor
ABRAMOVICI MIRON
US32 patents
⚠️ This page may combine multiple inventors who share the name “ABRAMOVICI MIRON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LUCENT TECHNOLOGIES INC
13 patentsUS6034538AMar 7, 2000
Virtual logic system for reconfigurable hardware
LUCENT TECHNOLOGIES INC233 citations99
US6003150ADec 14, 1999
Method for testing field programmable gate arrays
LUCENT TECHNOLOGIES INC86 citations96
US5991907ANov 23, 1999
Method for testing field programmable gate arrays
LUCENT TECHNOLOGIES INC45 citations96
US6202182B1Mar 13, 2001
Method and apparatus for testing field programmable gate arrays
LUCENT TECHNOLOGIES INC147 citations94
US6442732B1Aug 27, 2002
Virtual logic system for solving satisfiability problems using reconfigurable hardware
LUCENT TECHNOLOGIES INC61 citations93
US6108806AAug 22, 2000
Method of testing and diagnosing field programmable gate arrays
LUCENT TECHNOLOGIES INC43 citations91
US5831996ANov 3, 1998
Digital circuit test generator
LUCENT TECHNOLOGIES INC77 citations91
US5625630AApr 29, 1997
Increasing testability by clock transformation
LUCENT TECHNOLOGIES INC39 citations91
US5590135ADec 31, 1996
Testing a sequential circuit
LUCENT TECHNOLOGIES INC21 citations91
US6292916B1Sep 18, 2001
Parallel backtracing for satisfiability on reconfigurable hardware
LUCENT TECHNOLOGIES INC47 citations87
US5896401AApr 20, 1999
Fault simulator for digital circuitry
LUCENT TECHNOLOGIES INC30 citations86
US5566187AOct 15, 1996
Method for identifying untestable faults in logic circuits
LUCENT TECHNOLOGIES INC16 citations74
US5559811ASep 24, 1996
Method for identifying untestable and redundant faults in sequential logic circuits.
LUCENT TECHNOLOGIES INC8 citations74
DAFCA INC
6 patentsUS7296201B2Nov 13, 2007
Method to locate logic errors and defects in digital circuits
DAFCA INC275 citations99
US7058918B2Jun 6, 2006
Reconfigurable fabric for SoCs using functional I/O leads
DAFCA INC61 citations95
US7493434B1Feb 17, 2009
Determining the value of internal signals in a malfunctioning integrated circuit
DAFCA INC25 citations92
US7146548B1Dec 5, 2006
Fixing functional errors in integrated circuits
DAFCA INC19 citations92
US7137086B2Nov 14, 2006
Assertion checking using two or more cores
DAFCA INC30 citations92
US7305635B1Dec 4, 2007
Serial implementation of assertion checking logic circuit
DAFCA INC26 citations86
LATTICE SEMICONDUCTOR CORP
4 patentsUS6631487B1Oct 7, 2003
On-line testing of field programmable gate array resources
LATTICE SEMICONDUCTOR CORP85 citations98
US6574761B1Jun 3, 2003
On-line testing of the programmable interconnect network in field programmable gate arrays
LATTICE SEMICONDUCTOR CORP24 citations92
US6550030B1Apr 15, 2003
On-line testing of the programmable logic blocks in field programmable gate arrays
LATTICE SEMICONDUCTOR CORP32 citations92
US6530049B1Mar 4, 2003
On-line fault tolerant operation via incremental reconfiguration of field programmable gate arrays
LATTICE SEMICONDUCTOR CORP42 citations92
AGERE SYSTEMS INC
4 patentsUS6874108B1Mar 29, 2005
Fault tolerant operation of reconfigurable devices utilizing an adjustable system clock
AGERE SYSTEMS INC98 citations97
US7017096B2Mar 21, 2006
Sequential test pattern generation using clock-control design for testability structures
AGERE SYSTEMS INC13 citations84
US7650545B1Jan 19, 2010
Programmable interconnect for reconfigurable system-on-chip
AGERE SYSTEMS INC17 citations82
US6728917B2Apr 27, 2004
Sequential test pattern generation using combinational techniques
AGERE SYSTEMS INC9 citations74
UNIV NORTH CAROLINA
3 patentsUS6973608B1Dec 6, 2005
Fault tolerant operation of field programmable gate arrays
UNIV NORTH CAROLINA60 citations95
US6966020B1Nov 15, 2005
Identifying faulty programmable interconnect resources of field programmable gate arrays
UNIV NORTH CAROLINA33 citations92
US7412343B2Aug 12, 2008
Methods for delay-fault testing in field-programmable gate arrays
UNIV NORTH CAROLINA37 citations91