Inventor
HASEGAWA YOSHIEI
JP16 patents
⚠️ This page may combine multiple inventors who share the name “HASEGAWA YOSHIEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIHON MICRONICS KK
12 patentsUS6019612AFeb 1, 2000
Electrical connecting apparatus for electrically connecting a device to be tested
NIHON MICRONICS KK127 citations97
US5888075AMar 30, 1999
Auxiliary apparatus for testing device
NIHON MICRONICS KK87 citations95
US6271674B1Aug 7, 2001
Probe card
NIHON MICRONICS KK37 citations90
US7377788B2May 27, 2008
Electrical connecting apparatus and contact
NIHON MICRONICS KK16 citations83
US7165975B2Jan 23, 2007
Electrical connecting apparatus
NIHON MICRONICS KK12 citations80
US6657448B2Dec 2, 2003
Electrical connection apparatus
NIHON MICRONICS KK8 citations73
US6595794B2Jul 22, 2003
Electrical contact method and apparatus in semiconductor device inspection equipment
NIHON MICRONICS KK8 citations73
US5982184ANov 9, 1999
Test head for integrated circuits
NIHON MICRONICS KK12 citations73
US7532020B2May 12, 2009
Probe assembly
NIHON MICRONICS KK2 citations62
US6672877B2Jan 6, 2004
Contactor block and apparatus for electrical connection
NIHON MICRONICS KK0 citations51
US7764073B2Jul 27, 2010
Electrical connecting apparatus
NIHON MICRONICS KK0 citations41
US7559773B2Jul 14, 2009
Electrical connecting apparatus
NIHON MICRONICS KK0 citations41