Inventor
GUITTET PIERRE-YVES
DE6 patents
⚠️ This page may combine multiple inventors who share the name “GUITTET PIERRE-YVES”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
3 patentsUS7405089B2Jul 29, 2008
Method and apparatus for measuring a surface profile of a sample
INFINEON TECHNOLOGIES AG5 citations57
US7372579B2May 13, 2008
Apparatus and method for monitoring trench profiles and for spectrometrologic analysis
INFINEON TECHNOLOGIES AG6 citations54
US7262837B2Aug 28, 2007
Noninvasive method for characterizing and identifying embedded micropatterns
INFINEON TECHNOLOGIES AG0 citations39
MARKWORT LARS
3 patentsUS8460946B2Jun 11, 2013
Methods of processing and inspecting semiconductor substrates
MARKWORT LARS1 citations48
US8501503B2Aug 6, 2013
Methods of inspecting and manufacturing semiconductor wafers
MARKWORT LARS0 citations38
US8778702B2Jul 15, 2014
Method of inspecting and processing semiconductor wafers
MARKWORT LARS0 citations33