Inventor

KARLINSKY LEONID

IL26 patents

⚠️ This page may combine multiple inventors who share the name “KARLINSKY LEONID”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KARLINSKY LEONID

IBM

System and method for detection and classification of findings in images

Systems and methods for determining a camera pose of an image

Systems and methods for identifying a target object in an image

Systems and methods for identifying a target object in an image

Representative-based metric learning for classification and few-shot object detection

Method and system for producing digital image features

Systems and methods for training a model using a few-shot classification process

Unsupervised, semi-supervised, and supervised learning using deep learning based probabilistic generative models

Detecting graphical elements in charts using predicted heatmaps

System and method for augmenting few-shot object classification with semantic information from multiple sources

Anomaly detection using masked auto-encoder

Anomaly detection using neural radiance fields

Training visual language grounding models using separation loss

Semi-supervised learning of training gradients via task generation

Incremental learning without forgetting for classification and detection models

Automated end-to-end machine learning model optimization

Out-of-sample generating few-shot classification networks

TAFSSL: task adaptive feature sub-space learning for few-shot learning

Expert knowledge transfer using egocentric video

Training multi-modal models on documents using multiple instance learning

System and method for a visual recognition and/or detection of a potentially unbounded set of categories with limited examples per category and restricted query scope

APPLIED MATERIALS ISRAEL LTD

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of deep learning-based examination of a semiconductor specimen and system thereof

Method of deep learning-based examination of a semiconductor specimen and system thereof

System and method for patch based inspection