Inventor
HOSOKAWA Kiyotada
JP2 patents
Patents
2 patentsUS11920921B2Mar 5, 2024
Orientation characteristic measurement method, orientation characteristic measurement program, and orientation characteristic measurement device
HAMAMATSU PHOTONICS KK0 citations52
US11243073B2Feb 8, 2022
Orientation characteristic measurement method, orientation characteristic measurement program, and orientation characteristic measurement device
HAMAMATSU PHOTONICS KK0 citations52