Inventor
MORIOKA HIROSHI
JP40 patents
⚠️ This page may combine multiple inventors who share the name “MORIOKA HIROSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
16 patentsUS5463459AOct 31, 1995
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process
HITACHI LTD145 citations99
US5274434ADec 28, 1993
Method and apparatus for inspecting foreign particles on real time basis in semiconductor mass production line
HITACHI LTD218 citations99
US6759655B2Jul 6, 2004
Inspection method, apparatus and system for circuit pattern
HITACHI LTD74 citations98
US5233191AAug 3, 1993
Method and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production process
HITACHI LTD145 citations98
US6919564B2Jul 19, 2005
Inspection method, apparatus and system for circuit pattern
HITACHI LTD23 citations96
US6583634B1Jun 24, 2003
Method of inspecting circuit pattern and inspecting instrument
HITACHI LTD68 citations96
US6493082B2Dec 10, 2002
Inspection method, apparatus and system for circuit pattern
HITACHI LTD35 citations96
US6480279B2Nov 12, 2002
Inspection method, apparatus and system for circuit pattern
HITACHI LTD23 citations96
US6476913B1Nov 5, 2002
Inspection method, apparatus and system for circuit pattern
HITACHI LTD59 citations96
US6421122B2Jul 16, 2002
Inspection method, apparatus and system for circuit pattern
HITACHI LTD51 citations96
US6388747B2May 14, 2002
Inspection method, apparatus and system for circuit pattern
HITACHI LTD62 citations96
US7116816B2Oct 3, 2006
Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen
HITACHI LTD41 citations93
US6903821B2Jun 7, 2005
Inspection method, apparatus and system for circuit pattern
HITACHI LTD15 citations92
US6703850B2Mar 9, 2004
Method of inspecting circuit pattern and inspecting instrument
HITACHI LTD37 citations92
US6650409B1Nov 18, 2003
Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same system
HITACHI LTD39 citations92
US6504609B2Jan 7, 2003
Inspection method, apparatus and system for circuit pattern
HITACHI LTD7 citations74
TOYOTA MOTOR CO LTD
6 patentsUS6514175B2Feb 4, 2003
Hydraulic control system for transmissions
TOYOTA MOTOR CO LTD133 citations98
US6443871B2Sep 3, 2002
Control apparatus and method of belt-type continuously variable transmission
TOYOTA MOTOR CO LTD31 citations93
US6565465B2May 20, 2003
Continuously variable belt transmission
TOYOTA MOTOR CO LTD42 citations90
US6405115B2Jun 11, 2002
Shift control system for continuously variable transmissions
TOYOTA MOTOR CO LTD10 citations74
US6449948B2Sep 17, 2002
Hydraulic circuit cleaning apparatus and method
TOYOTA MOTOR CO LTD3 citations62
US7455618B2Nov 25, 2008
Fluid level regulating method and fluid temperature regulator for automatic transmission
TOYOTA MOTOR CO LTD3 citations60
FUJITSU MICROELECTRONICS LTD
4 patentsUS7601576B2Oct 13, 2009
Method for fabricating semiconductor device
FUJITSU MICROELECTRONICS LTD24 citations91
US7670759B2Mar 2, 2010
Micro pattern forming method and semiconductor device manufacturing method
FUJITSU MICROELECTRONICS LTD5 citations63
US7550394B2Jun 23, 2009
Semiconductor device and fabrication process thereof
FUJITSU MICROELECTRONICS LTD3 citations63
US7501686B2Mar 10, 2009
Semiconductor device and method for manufacturing the same
FUJITSU MICROELECTRONICS LTD6 citations62
RENESAS TECH CORP
2 patentsUS7177020B2Feb 13, 2007
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process
RENESAS TECH CORP15 citations92
US6894773B2May 17, 2005
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process
RENESAS TECH CORP11 citations74