Inventor

MIYAI HIROSHI

JP55 patents

⚠️ This page may combine multiple inventors who share the name “MIYAI HIROSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MIYAI HIROSHI

HITACHI LTD

Pattern inspection method and apparatus

Method and apparatus for inspecting or measuring a sample based on charged-particle beam imaging, and a charged-particle beam apparatus

Method and apparatus for inspecting a semiconductor device

Method of inspecting circuit pattern and inspecting instrument

Non-destructive inspection apparatus and inspection system using it

Pattern inspection method and apparatus

Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen

Circuit pattern inspection method and apparatus

Circuit pattern inspection method and apparatus

Method and its apparatus for inspecting a pattern

Method of inspecting circuit pattern and inspecting instrument

Non-destructive inspection apparatus and inspection system using it

Imaging method of X-ray computerized tomography and apparatus for X-ray computerized tomography

Pattern inspection method and apparatus

Pattern inspection method and apparatus

Pattern inspection method and apparatus

Pattern inspection method and apparatus

Method and apparatus for inspecting a semiconductor device

Method of fabricating a semiconductor device

Non-destructive inspection apparatus and inspection system using it

Apparatus for inspecting a specimen

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

Image display apparatus and method for compensating display image of image display apparatus

Presentation system, a display device, and a program

Color image display apparatus

Projection type image display apparatus with circuit for correcting luminance nonuniformity

Image display

Remote control system for controlling a television receiver

Rear projection type image display unit

Luminance correction circuit and video display monitor thereof

Projection type image displaying apparatus

Optically addressed picture display apparatus

Video display device

HITACHI HIGH TECH CORP

Inspection method and apparatus using an electron beam

Inspection method and apparatus using an electron beam

Method of alignment for efficient defect review

Circuit pattern inspection method and its apparatus

Inspection apparatus for inspecting patterns of a substrate

Method of alignment for efficient defect review

Inspection apparatus and inspection method using electron beam

Inspection apparatus and inspection method using electron beam

PANASONIC CORP

Light emission method, light emitting apparatus and projection display apparatus

Display apparatus, display method, program and recording medium

Illumination device with plural color light sources and first and second integrators

MIHARA KAZUHIRO

Image system, image display device and image viewing eyeglasses with them

Image system, display device and eyeglasses device used in the same

SAIGO KATSUO

Color conversion device, color conversion table and color conversion method

HIROI TAKASHI

Charged particle beam device for scanning a sample using a charged particle beam to inspect the sample

NOZOE MARI

Pattern check device and pattern check method

MATSUMOTO KEIZO

Image signal processing apparatus, image signal processing method, recording medium, and integrated circuit

OMINAMI YUSUKE

Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscope