Inventor
RIESS PHILIPP
DE23 patents
⚠️ This page may combine multiple inventors who share the name “RIESS PHILIPP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RIESS PHILIPP
8 patentsUS8062971B2Nov 22, 2011
Dual damascene process
RIESS PHILIPP18 citations92
US8314452B2Nov 20, 2012
MIM capacitors in semiconductor components
RIESS PHILIPP6 citations82
US8508019B2Aug 13, 2013
Capacitor structure
RIESS PHILIPP3 citations61
US8101495B2Jan 24, 2012
MIM capacitors in semiconductor components
RIESS PHILIPP3 citations61
US8860225B2Oct 14, 2014
Devices formed with dual damascene process
RIESS PHILIPP0 citations51
US8518811B2Aug 27, 2013
Schottky diodes having metal gate electrodes and methods of formation thereof
RIESS PHILIPP0 citations51
US8242579B2Aug 14, 2012
Capacitor structure
RIESS PHILIPP0 citations51
US8710590B2Apr 29, 2014
Electronic component and a system and method for producing an electronic component
RIESS PHILIPP0 citations40
INFINEON TECHNOLOGIES AG
7 patentsUS6905892B2Jun 14, 2005
Operating method for a semiconductor component
INFINEON TECHNOLOGIES AG102 citations97
US7906831B2Mar 15, 2011
Semiconductor device with capacitor arrangement electrically coupled to inductor coil
INFINEON TECHNOLOGIES AG10 citations84
US7557426B2Jul 7, 2009
Integrated capacitor structure
INFINEON TECHNOLOGIES AG8 citations84
US6930501B2Aug 16, 2005
Method for determining an ESD/latch-up strength of an integrated circuit
INFINEON TECHNOLOGIES AG18 citations82
US7009404B2Mar 7, 2006
Method and device for testing the ESD resistance of a semiconductor component
INFINEON TECHNOLOGIES AG6 citations62
US8901624B2Dec 2, 2014
Schottky diodes having metal gate electrodes and methods of formation thereof
INFINEON TECHNOLOGIES AG0 citations51
US7485945B2Feb 3, 2009
Integrated capacitor structure
INFINEON TECHNOLOGIES AG0 citations51
BARTH HANS-JOACHIM
3 patentsUS8138539B2Mar 20, 2012
Semiconductor devices and methods of manufacture thereof
BARTH HANS-JOACHIM14 citations83
US9793220B2Oct 17, 2017
Detection of environmental conditions in a semiconductor chip
BARTH HANS-JOACHIM2 citations68
US8569820B2Oct 29, 2013
Capacitor having a plurality of parallel conductive members
BARTH HANS-JOACHIM1 citations51