Inventor

TOKUHARA ISAO

JP2 patents

Patents

2 patents

US11257205B2Feb 22, 2022

Image measuring method and apparatus

MITUTOYO CORP0 citations47

US10102631B2Oct 16, 2018

Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program

MITUTOYO CORP0 citations37