P

Inventor

NIIMURA YASUSHI

JP22 patents
⚠️ This page may combine multiple inventors who share the name “NIIMURA YASUSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FUJI ELECTRIC CO LTD

15 patents
US9881997B2Jan 30, 2018

Semiconductor device and manufacturing method of semiconductor device

FUJI ELECTRIC CO LTD25 citations93
US9431290B2Aug 30, 2016

Semiconductor device and manufacturing method therefor

FUJI ELECTRIC CO LTD8 citations83
US9076725B2Jul 7, 2015

Semiconductor device and manufacturing method therefor

FUJI ELECTRIC CO LTD10 citations83
US6894319B2May 17, 2005

Semiconductor device

FUJI ELECTRIC CO LTD9 citations74
US9653595B2May 16, 2017

Semiconductor device and semiconductor device fabrication method

FUJI ELECTRIC CO LTD4 citations71
US9362393B2Jun 7, 2016

Vertical semiconductor device including element active portion and voltage withstanding structure portion, and method of manufacturing the vertical semiconductor device

FUJI ELECTRIC CO LTD6 citations71
US10211286B2Feb 19, 2019

Semiconductor device

FUJI ELECTRIC CO LTD0 citations51
US10008562B1Jun 26, 2018

Semiconductor device manufacturing method

FUJI ELECTRIC CO LTD0 citations51
US9887260B2Feb 6, 2018

Semiconductor device and semiconductor device manufacturing method

FUJI ELECTRIC CO LTD0 citations51
US9608057B2Mar 28, 2017

Semiconductor device and method for manufacturing semiconductor device

FUJI ELECTRIC CO LTD0 citations51
US9331194B2May 3, 2016

Semiconductor device and method for manufacturing semiconductor device

FUJI ELECTRIC CO LTD0 citations51
US9496370B2Nov 15, 2016

Manufacturing method of semiconductor apparatus and semiconductor apparatus

FUJI ELECTRIC CO LTD0 citations50
US9312379B2Apr 12, 2016

Manufacturing method of semiconductor apparatus and semiconductor apparatus

FUJI ELECTRIC CO LTD0 citations50
US10553505B2Feb 4, 2020

Assessment method, and semiconductor device manufacturing method

FUJI ELECTRIC CO LTD0 citations48
US10381274B2Aug 13, 2019

Assessment method, and semiconductor device manufacturing method

FUJI ELECTRIC CO LTD0 citations48

FUJI ELEC DEVICE TECH CO LTD

3 patents

FUJI ELECTRIC SYSTEMS CO LTD

2 patents

FUJI ELECTRIC HOLDINGS

1 patent

NIIMURA YASUSHI

1 patent