Inventor
PURTELL ROBERT J
US24 patents
⚠️ This page may combine multiple inventors who share the name “PURTELL ROBERT J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
19 patentsUS6657244B1Dec 2, 2003
Structure and method to reduce silicon substrate consumption and improve gate sheet resistance during silicide formation
IBM55 citations96
US6965133B2Nov 15, 2005
Method of base formation in a BiCMOS process
IBM16 citations92
US7504336B2Mar 17, 2009
Methods for forming CMOS devices with intrinsically stressed metal silicide layers
IBM16 citations84
US6875286B2Apr 5, 2005
Solid CO2 cleaning
IBM15 citations82
US7456095B2Nov 25, 2008
Method and apparatus for forming nickel silicide with low defect density in FET devices
IBM4 citations74
US7390721B2Jun 24, 2008
Methods of base formation in a BiCMOS process
IBM6 citations74
US7109116B1Sep 19, 2006
Method for reducing dendrite formation in nickel silicon salicide processes
IBM7 citations74
US7081208B2Jul 25, 2006
Method to build a microfilter
IBM9 citations74
US6927393B2Aug 9, 2005
Method of in situ monitoring of supercritical fluid process conditions
IBM8 citations74
US7696034B2Apr 13, 2010
Methods of base formation in a BiCOMS process
IBM6 citations73
US7759741B2Jul 20, 2010
Method and apparatus for forming nickel silicide with low defect density in FET devices
IBM4 citations63
US7659199B2Feb 9, 2010
Air break for improved silicide formation with composite caps
IBM2 citations63
US7320938B2Jan 22, 2008
Method for reducing dendrite formation in nickel silicon salicide processes
IBM2 citations63
US7485572B2Feb 3, 2009
Method for improved formation of cobalt silicide contacts in semiconductor devices
IBM3 citations62
US7344983B2Mar 18, 2008
Clustered surface preparation for silicide and metal contacts
IBM4 citations62
US7208414B2Apr 24, 2007
Method for enhanced uni-directional diffusion of metal and subsequent silicide formation
IBM3 citations62
US7129169B2Oct 31, 2006
Method for controlling voiding and bridging in silicide formation
IBM2 citations62
US7417290B2Aug 26, 2008
Air break for improved silicide formation with composite caps
IBM2 citations54
US7622386B2Nov 24, 2009
Method for improved formation of nickel silicide contacts in semiconductor devices
IBM1 citations49
PURTELL ROBERT J
3 patentsUS8569183B2Oct 29, 2013
Low temperature dielectric flow using microwaves
PURTELL ROBERT J5 citations71
US8143125B2Mar 27, 2012
Structure and method for forming a salicide on the gate electrode of a trench-gate FET
PURTELL ROBERT J3 citations61
US8658500B2Feb 25, 2014
Single crystal U-MOS gates using microwave crystal regrowth
PURTELL ROBERT J2 citations52