Inventor
HTET PAING Z
US6 patents
Patents
6 patentsUS12224017B2Feb 11, 2025
Read level compensation for partially programmed blocks of memory devices
MICRON TECHNOLOGY INC2 citations70
US12272408B2Apr 8, 2025
Partial block read level voltage compensation to decrease read trigger rates
MICRON TECHNOLOGY INC2 citations68
US12217799B2Feb 4, 2025
Parallelized defect detection across multiple sub-blocks in a memory device
MICRON TECHNOLOGY INC1 citations62
US11715547B2Aug 1, 2023
Scan optimization using data selection across wordline of a memory array
MICRON TECHNOLOGY INC0 citations59
US11475969B2Oct 18, 2022
Scan optimization using data selection across wordline of a memory array
MICRON TECHNOLOGY INC1 citations59
US12315575B2May 27, 2025
Boost voltage modulated corrective read
MICRON TECHNOLOGY INC0 citations48