Inventor

BAUR CHRISTOF

US39 patents

⚠️ This page may combine multiple inventors who share the name “BAUR CHRISTOF”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BAUR CHRISTOF

ZEISS CARL SMT GMBH

Scanning particle microscope and method for determining a position change of a particle beam of the scanning particle microscope

Method and apparatus for examining a measuring tip of a scanning probe microscope

Method and apparatus for removing a particle from a photolithographic mask

Device and method for operating a bending beam in a closed control loop

Device and method for operating a bending beam in a closed control loop

Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscope

Method and apparatuses for disposing of excess material of a photolithographic mask

Method and apparatuses for disposing of excess material of a photolithographic mask

Method and apparatuses for disposing of excess material of a photolithographic mask

Apparatus and method for a scanning probe microscope

Apparatus and method for examining and/or processing a sample

Apparatus and method for examining and/or processing a sample

Apparatus and method for a scanning probe microscope

Scanning probe microscope and method for increasing a scan speed of a scanning probe microscope in the step-in scan mode

Device and method for analyzing a defect of a photolithographic mask or of a wafer

Method and apparatus for examining a measuring tip of a scanning probe microscope

Device and method for analysing a defect of a photolithographic mask or of a wafer

Method and apparatus for removing a particle from a photolithographic mask

Method and apparatus for removing a particle from a photolithographic mask

Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope

Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope

Device and method for operating a bending beam in a closed control loop

Probe system and method for receiving a probe of a scanning probe microscope

Apparatus and method for removing a single particulate from a substrate

Apparatus and method for removing a single particulate from a substrate

Method, device and computer program for repairing a mask defect

Scanning probe microscope and method for examining a surface with a high aspect ratio

Beam blanker and method for blanking a charged particle beam

ZYVEX CORP

Positioning device for microscopic motion

Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces

Nano-manipulation by gyration

System and method for accurate positioning of a scanning probe microscope

Probe current imaging

ZYVEX INSTR LLC

Charged particle beam device probe operation

Charged particle beam device probe operation

ZYVEX LABS LLC

Patterned atomic layer epitaxy

Patterned atomic layer epitaxy

ZEISS CARL SMS GMBH

Apparatus and method for analyzing and modifying a specimen surface

Apparatus and method for investigating an object