Inventor
YAMADA JUNZO
JP29 patents
⚠️ This page may combine multiple inventors who share the name “YAMADA JUNZO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ANDO ELECTRIC
22 patentsUS6166845ADec 26, 2000
Electro-optic probe
ANDO ELECTRIC22 citations92
US6567760B1May 20, 2003
Electro-optic sampling oscilloscope
ANDO ELECTRIC17 citations83
US6445198B1Sep 3, 2002
Electro-optic sampling probe and a method for adjusting the same
ANDO ELECTRIC7 citations73
US6384590B1May 7, 2002
Light receiving circuit for use in electro-optic sampling oscilloscope
ANDO ELECTRIC13 citations73
US6297651B1Oct 2, 2001
Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system module
ANDO ELECTRIC8 citations73
US6232765B1May 15, 2001
Electro-optical oscilloscope with improved sampling
ANDO ELECTRIC8 citations73
US6201235B1Mar 13, 2001
Electro-optic sampling oscilloscope
ANDO ELECTRIC14 citations73
US6507014B2Jan 14, 2003
Electro-optic probe
ANDO ELECTRIC3 citations62
US6469528B2Oct 22, 2002
Electro-optic sampling probe and measuring method using the same
ANDO ELECTRIC5 citations62
US6410906B1Jun 25, 2002
Electro-optic probe
ANDO ELECTRIC5 citations62
US6407561B1Jun 18, 2002
Probe for electro-optic sampling oscilloscope
ANDO ELECTRIC2 citations62
US6388454B1May 14, 2002
Electro-optic sampling prober
ANDO ELECTRIC4 citations62
US6369562B2Apr 9, 2002
Electro-optical probe for oscilloscope measuring signal waveform
ANDO ELECTRIC5 citations62
US6348787B1Feb 19, 2002
Electrooptic probe
ANDO ELECTRIC2 citations62
US6342783B1Jan 29, 2002
Electrooptic probe
ANDO ELECTRIC3 citations62
US6337565B1Jan 8, 2002
Electro-optic probe
ANDO ELECTRIC5 citations62
US6297650B1Oct 2, 2001
Electrooptic probe
ANDO ELECTRIC4 citations62
US6288531B1Sep 11, 2001
Probe for electro-optic sampling oscilloscope
ANDO ELECTRIC3 citations62
US6087838AJul 11, 2000
Signal processing circuit for electro-optic probe
ANDO ELECTRIC2 citations62
US6347005B1Feb 12, 2002
Electro-optic sampling probe
ANDO ELECTRIC3 citations61
US6288529B1Sep 11, 2001
Timing generation circuit for an electro-optic oscilloscope
ANDO ELECTRIC4 citations60
US6403946B1Jun 11, 2002
Electro-optic sampling probe comprising photodiodes insulated from main frame of EOS optical system
ANDO ELECTRIC1 citations52
NIPPON TELEGRAPH & TELEPHONE
7 patentsUS4747080AMay 24, 1988
Semiconductor memory having self correction function
NIPPON TELEGRAPH & TELEPHONE89 citations96
US5486774AJan 23, 1996
CMOS logic circuits having low and high-threshold voltage transistors
NIPPON TELEGRAPH & TELEPHONE136 citations95
US5400342AMar 21, 1995
Semiconductor memory having test circuit and test method thereof
NIPPON TELEGRAPH & TELEPHONE87 citations95
US4771404ASep 13, 1988
Memory device employing multilevel storage circuits
NIPPON TELEGRAPH & TELEPHONE88 citations93
US4694428ASep 15, 1987
Semiconductor memory
NIPPON TELEGRAPH & TELEPHONE31 citations92
US4460998AJul 17, 1984
Semiconductor memory devices
NIPPON TELEGRAPH & TELEPHONE43 citations92
US4456980AJun 26, 1984
Semiconductor memory device
NIPPON TELEGRAPH & TELEPHONE28 citations92