Inventor

WAI JAMES KWOK-YUE

US2 patents

Patents

2 patents

US6876207B2Apr 5, 2005

System and method for testing devices

HEWLETT PACKARD DEVELOPMENT CO24 citations83

US6584600B2Jun 24, 2003

Hierarchical metal one usage tool for child level leaf cell

HEWLETT PACKARD DEVELOPMENT CO0 citations47