Inventor

CHEN TO-YU

TW4 patents

⚠️ This page may combine multiple inventors who share the name “CHEN TO-YU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG

2 patents

US9098894B2Aug 4, 2015

Defect determination in integrated circuit manufacturing process

TAIWAN SEMICONDUCTOR MFG2 citations51

US7205167B2Apr 17, 2007

Method to detect photoresist residue on a semiconductor device

TAIWAN SEMICONDUCTOR MFG1 citations49

TAIWAN SEMICONDUCTOR MFG CO LTD

2 patents

US9423359B2Aug 23, 2016

Wafer charging electromagnetic inspection tool and method of using

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations40

US12540904B2Feb 3, 2026

Machine learning-based transformation of low-resolution wafer inspection images to high resolution images

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations36