Inventor
TSUJIKAWA HIROYUKI
JP19 patents
⚠️ This page may combine multiple inventors who share the name “TSUJIKAWA HIROYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
18 patentsUS7171645B2Jan 30, 2007
Semiconductor device, method of generating pattern for semiconductor device, method of manufacturing semiconductor device and device of generating pattern used for semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD22 citations92
US7062732B2Jun 13, 2006
Semiconductor device, method of generating pattern for semiconductor device, method of manufacturing semiconductor device and device for generating pattern used for semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD30 citations92
US6434730B1Aug 13, 2002
Pattern forming method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD68 citations92
US6303251B1Oct 16, 2001
Mask pattern correction process, photomask and semiconductor integrated circuit device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD37 citations92
US6782347B2Aug 24, 2004
Method for optimizing electromagnetic interference and method for analyzing the electromagnetic interference
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD20 citations91
US6810340B2Oct 26, 2004
Electromagnetic disturbance analysis method and apparatus and semiconductor device manufacturing method using the method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD19 citations89
US7039572B1May 2, 2006
Method of analyzing electromagnetic interference
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD27 citations87
US6710449B2Mar 23, 2004
Interconnection structure and method for designing the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD25 citations87
US7278124B2Oct 2, 2007
Design method for semiconductor integrated circuit suppressing power supply noise
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD13 citations82
US6876210B2Apr 5, 2005
Method and apparatus for analyzing electromagnetic interference
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD14 citations82
US6490709B1Dec 3, 2002
Latch-up verifying method and latch-up verifying apparatus capable of varying over-sized region
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD6 citations74
US6754598B2Jun 22, 2004
Electromagnetic interference analysis method and apparatus
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD10 citations73
US7114144B2Sep 26, 2006
Mask pattern inspecting method, inspection apparatus, inspecting data used therein and inspecting data generating method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD7 citations72
US6959250B1Oct 25, 2005
Method of analyzing electromagnetic interference
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD10 citations71
US6943129B2Sep 13, 2005
Interconnection structure and method for designing the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD6 citations70
US7307333B2Dec 11, 2007
Semiconductor device method of generating semiconductor device pattern method of semiconductor device and pattern generator for semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD6 citations69
US6183920B1Feb 6, 2001
Semiconductor device geometrical pattern correction process and geometrical pattern extraction process
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations62
US6718528B2Apr 6, 2004
Latch-up verifying method and latch-up verifying apparatus capable of varying over-sized region
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD0 citations52