Inventor
HITOMI KEIICHIRO
JP15 patents
⚠️ This page may combine multiple inventors who share the name “HITOMI KEIICHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
6 patentsUS7875850B2Jan 25, 2011
Standard component for calibration and electron-beam system using the same
HITACHI HIGH TECH CORP8 citations84
US7750296B2Jul 6, 2010
Scanning electron microscope and calibration of image distortion
HITACHI HIGH TECH CORP3 citations62
US7612334B2Nov 3, 2009
Standard reference component for calibration, fabrication method for the same, and scanning electron microscope using the same
HITACHI HIGH TECH CORP5 citations62
US11276548B2Mar 15, 2022
Charged particle beam device and charged particle beam adjustment method
HITACHI HIGH TECH CORP0 citations58
US11626266B2Apr 11, 2023
Charged particle beam device
HITACHI HIGH TECH CORP0 citations49
US7683313B2Mar 23, 2010
Charged particle beam measurement equipment, size correction and standard sample for correction
HITACHI HIGH TECH CORP0 citations41
HITOMI KEIICHIRO
3 patentsUS12314355B2May 27, 2025
Information processing system, device, and authentication method
HITOMI KEIICHIRO1 citations60
US10546017B2Jan 28, 2020
Displaying terms having corresponding character strings on a display
HITOMI KEIICHIRO1 citations55
US9200896B2Dec 1, 2015
Pattern dimension measurement method and charged particle beam microscope used in same
HITOMI KEIICHIRO0 citations39