Inventor
YANG LING-WUU
TW29 patents
⚠️ This page may combine multiple inventors who share the name “YANG LING-WUU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MACRONIX INT CO LTD
26 patentsUS7382054B2Jun 3, 2008
Method for forming self-aligned contacts and local interconnects simultaneously
MACRONIX INT CO LTD14 citations84
US7442620B2Oct 28, 2008
Methods for forming a trench isolation structure with rounded corners in a silicon substrate
MACRONIX INT CO LTD9 citations83
US7888804B2Feb 15, 2011
Method for forming self-aligned contacts and local interconnects simultaneously
MACRONIX INT CO LTD5 citations74
US7045419B2May 16, 2006
Elimination of the fast-erase phenomena in flash memory
MACRONIX INT CO LTD7 citations73
US10388664B2Aug 20, 2019
Integrated circuit device with layered trench conductors
MACRONIX INT CO LTD5 citations71
US9589086B2Mar 7, 2017
Method for measuring and analyzing surface structure of chip or wafer
MACRONIX INT CO LTD5 citations71
US7629265B2Dec 8, 2009
Cleaning method for use in semiconductor device fabrication
MACRONIX INT CO LTD3 citations63
US7531411B2May 12, 2009
Apparatus and method for a non-volatile memory structure comprising a multi-layer silicon-rich, silicon nitride trapping layer
MACRONIX INT CO LTD5 citations62
US6887757B2May 3, 2005
Method of manufacturing flash memory
MACRONIX INT CO LTD2 citations62
US12408342B2Sep 2, 2025
Memory device with multi-layered charge storage stack
MACRONIX INT CO LTD0 citations61
US9006003B1Apr 14, 2015
Method of detecting bitmap failure associated with physical coordinate
MACRONIX INT CO LTD3 citations61
US6943118B2Sep 13, 2005
Method of fabricating flash memory
MACRONIX INT CO LTD4 citations61
US6812096B2Nov 2, 2004
Method for fabrication a flash memory device having self-aligned contact
MACRONIX INT CO LTD2 citations61
US8735958B1May 27, 2014
Multi-layer polysilicon suppression of implant species penetration
MACRONIX INT CO LTD2 citations60
US10354924B2Jul 16, 2019
Semiconductor memory device and method of manufacturing the same
MACRONIX INT CO LTD1 citations59
US10497652B1Dec 3, 2019
Semiconductor substrate and semiconductor device
MACRONIX INT CO LTD0 citations52
US7938972B2May 10, 2011
Fabrication method of electronic device
MACRONIX INT CO LTD0 citations52
US7517780B2Apr 14, 2009
Method for eliminating polycide voids through nitrogen implantation
MACRONIX INT CO LTD0 citations52
US7335610B2Feb 26, 2008
Ultraviolet blocking layer
MACRONIX INT CO LTD1 citations52
US9116108B1Aug 25, 2015
Electron beam inspection optimization
MACRONIX INT CO LTD1 citations51
US9244112B2Jan 26, 2016
Method for detecting an electrical defect of contact/via plugs
MACRONIX INT CO LTD1 citations50
US9236497B2Jan 12, 2016
Methods for fabricating semiconductor device
MACRONIX INT CO LTD1 citations49
US7553755B2Jun 30, 2009
Method for symmetric deposition of metal layer
MACRONIX INT CO LTD0 citations49
US12027584B2Jul 2, 2024
Transistor structure and manufacturing method thereof
MACRONIX INT CO LTD0 citations45
US7951707B2May 31, 2011
Etching method for semiconductor element
MACRONIX INT CO LTD0 citations42
US9869712B2Jan 16, 2018
Method and system for detecting defects of wafer by wafer sort
MACRONIX INT CO LTD0 citations41