Inventor
HOWLAND WILLIAM H
US14 patents
⚠️ This page may combine multiple inventors who share the name “HOWLAND WILLIAM H”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SOLID STATE MEASUREMENTS INC
8 patentsUS6842029B2Jan 11, 2005
Non-invasive electrical measurement of semiconductor wafers
SOLID STATE MEASUREMENTS INC30 citations92
US6788076B2Sep 7, 2004
Apparatus for determining doping concentration of a semiconductor wafer
SOLID STATE MEASUREMENTS INC13 citations83
US6741093B2May 25, 2004
Method of determining one or more properties of a semiconductor wafer
SOLID STATE MEASUREMENTS INC15 citations83
US6632691B1Oct 14, 2003
Apparatus and method for determining doping concentration of a semiconductor wafer
SOLID STATE MEASUREMENTS INC15 citations83
US6972582B2Dec 6, 2005
Apparatus and method for measuring semiconductor wafer electrical properties
SOLID STATE MEASUREMENTS INC8 citations73
US6836139B2Dec 28, 2004
Method and apparatus for determining defect and impurity concentration in semiconducting material of a semiconductor wafer
SOLID STATE MEASUREMENTS INC8 citations73
US6657454B2Dec 2, 2003
High speed threshold voltage and average surface doping measurements
SOLID STATE MEASUREMENTS INC7 citations73
US6894519B2May 17, 2005
Apparatus and method for determining electrical properties of a semiconductor wafer
SOLID STATE MEASUREMENTS INC4 citations62