Inventor
CHO YONG-HWAN
KR5 patents
⚠️ This page may combine multiple inventors who share the name “CHO YONG-HWAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
3 patentsUS7941714B2May 10, 2011
Parallel bit test apparatus and parallel bit test method capable of reducing test time
SAMSUNG ELECTRONICS CO LTD11 citations80
US9261555B2Feb 16, 2016
Methods of measuring and controlling inner temperature of a chamber included in a test handler
SAMSUNG ELECTRONICS CO LTD1 citations43
US8051341B2Nov 1, 2011
Semiconductor memory device having test address generating circuit and method of testing semiconductor memory device having a test address generating circuit
SAMSUNG ELECTRONICS CO LTD0 citations33