Inventor
IKEMURA Kenichiro
JP10 patents
Patents
10 patentsUS11694324B2Jul 4, 2023
Inspection apparatus and inspection method
HAMAMATSU PHOTONICS KK2 citations71
US9423339B2Aug 23, 2016
Spectrum measuring device and spectrum measuring method
HAMAMATSU PHOTONICS KK5 citations71
US12392724B2Aug 19, 2025
Measurement device
HAMAMATSU PHOTONICS KK1 citations63
US12405228B2Sep 2, 2025
Inspection apparatus and inspection method
HAMAMATSU PHOTONICS KK0 citations61
US12387309B2Aug 12, 2025
Inspection apparatus and inspection method
HAMAMATSU PHOTONICS KK0 citations61
US12013349B2Jun 18, 2024
Inspection apparatus and inspection method
HAMAMATSU PHOTONICS KK1 citations61
US12442775B2Oct 14, 2025
Measuring device
HAMAMATSU PHOTONICS KK0 citations51
US10816402B2Oct 27, 2020
Spectrometry device and spectrometry method
HAMAMATSU PHOTONICS KK0 citations39
US10209189B2Feb 19, 2019
Spectrum measuring device, spectrum measuring method, and specimen container
HAMAMATSU PHOTONICS KK0 citations39
US10094779B2Oct 9, 2018
Optical measurement device and optical measurement method
HAMAMATSU PHOTONICS KK0 citations39